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Sep 2003

Volume 74, Issue 9, pp. 3909-4222

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back to top PARTICLE SOURCES, OPTICS and ACCELERATION; PARTICLE DETECTORS

Calculation and measurement of the time-of-flight spread in a hemispherical electron energy analyzer

O. Kugeler, S. Marburger, and U. Hergenhahn

Rev. Sci. Instrum. 74, 3955 (2003); http://dx.doi.org/10.1063/1.1599060 (7 pages) | Cited 5 times

Online Publication Date: 20 August 2003

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We have determined the transit time distribution of electrons passing a high resolution hemispherical energy analyzer. Comparison of our measured results with analytical expressions reveals that differing transit times between electrons of equal kinetic energy mainly build up on the Kepler-type orbits on which the electrons travel through the hemispheres. To facilitate the measurements, we have installed a position sensitive electron detector capable of single event detection into our spectrometer. This device is based on a delay-line anode. We briefly report on the energy resolution achieved in comparison with a slower readout system via a fluorescent screen. The transit time distribution is important in coincidence experiments, where electrons detected in the hemispherical analyzer are to be related to events in other detectors. We discuss the feasibility of electron–electron coincidence experiments using a hemispherical detector plus a time-of-flight drift tube for energy discrimination of an electron pair. © 2003 American Institute of Physics.
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29.40.Gx Tracking and position-sensitive detectors

Characterization of sheet electron beams from planar crossed-field secondary emission diodes

Yuri M. Saveliev, Wilson Sibbett, and David M. Parkes

Rev. Sci. Instrum. 74, 3962 (2003); http://dx.doi.org/10.1063/1.1597949 (6 pages)

Online Publication Date: 20 August 2003

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Sheet electron beams of 9 cm width having linear current densities of 1.5–3.0 A/cm have been generated from a planar crossed-field secondary emission (CFSE) electron source operated at ∼20 kV diode voltage. The output electron beam consists of two parallel closely spaced sheets of electron flow originated from each side of the cathode. The full width at half maximum of each electron sheet is 1–2 mm depending on the magnetic field strength. The output current depends strongly on the diode voltage as I∝Un where n = 5.0±0.5. At a given magnetic field strength B, there is a minimal diode voltage Umin at which the diode is able to maintain a self-sustained operation. The values of Umin for a range of magnetic fields B have been linked to the potential of the diode electron flow V0 = 0.42 kV which is approximately ten times greater than the first cross-over voltage in the secondary emission coefficient function. The planar CFSE electron source is capable of operating in a long ∼2 ms regime. The generation of low-voltage (<10 kV) electron beams at an elevated background gas pressure of 10−2 mbar has been also demonstrated. © 2003 American Institute of Physics.
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29.25.Bx Electron sources
07.77.Ka Charged-particle beam sources and detectors
79.70.+q Field emission, ionization, evaporation, and desorption
79.20.Hx Electron impact: secondary emission
41.75.Fr Electron and positron beams

Radiation measurements by a cryogenic pn junction InSb detector with operating temperatures up to 115 K

Ikuo Kanno, Fumiki Yoshihara, Ryo Nouchi, Osamu Sugiura, Yasuhiro Murase, Tatsuya Nakamura, and Masaki Katagiri

Rev. Sci. Instrum. 74, 3968 (2003); http://dx.doi.org/10.1063/1.1599067 (6 pages) | Cited 8 times

Online Publication Date: 20 August 2003

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Pn junction-type radiation detectors were fabricated with an InSb substrate. The detectors had 1000 times higher resistances than those of previously reported Schottky-type detectors. The output pulses of the preamplifier were analyzed from the point of view of the contribution of electrons and holes. The energy spectra of 241Am alpha particles were measured at operating temperatures of up to 115 K. The inherent voltage of the detector was estimated. © 2003 American Institute of Physics.
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29.40.Wk Solid-state detectors
07.20.Mc Cryogenics; refrigerators, low-temperature detectors, and other low-temperature equipment
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