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Mar 2002

Volume 73, Issue 3, pp. 1103-1683

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Manipulation and detection of x rays on the femtosecond time scale (invited)

B. W. Adams

Rev. Sci. Instrum. 73, 1632 (2002); http://dx.doi.org/10.1063/1.1425385 (5 pages) | Cited 2 times

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X-ray studies with femtosecond time resolution will become highly important within the next few years because of a confluence of scientific interest and availability of sources. This poses a challenge to instrumentation: Rapid switches and more elaborate devices for coherent control of x rays will have to be developed, and detectors will have to cope with high intensities and orders of magnitude better time resolution. Especially for detectors, a transition from classical electronics to optical control will become necessary to achieve few-femtosecond time resolution. The purpose of this article is to highlight a few of the challenges and to give a few examples of high-speed purely optical control and detection of x rays. © 2002 American Institute of Physics.
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07.85.Fv X- and γ-ray sources, mirrors, gratings, and detectors
07.85.Qe Synchrotron radiation instrumentation
06.60.Jn High-speed techniques (microsecond to femtosecond)
41.50.+h X-ray beams and x-ray optics
41.60.Ap Synchrotron radiation
07.05.Dz Control systems

Soft x-ray microscopy and extreme ultraviolet lithography: Imaging in the 20–50 nm regime (abstract) (invited)

David Attwood

Rev. Sci. Instrum. 73, 1637 (2002); http://dx.doi.org/10.1063/1.1448129 (1 page)

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Advances in short wavelength optics, covering the range from 1 to 14 nm, are providing new results and new opportunities. Zone plate lenses [E. Anderson et al., J. Vac. Sci. Techno. B 18, 2970 (2000)] for soft x-ray microscopy [G. Denbeaux, Rev. Sci. Instrum. (these proceedings); W. Chao, Proc. SPIE 4146, 171 (2000)] are now made to high accuracy with outer zone widths of 25 nm, and demonstrated resolution of 23 nm with proper illumination and stability. These permit important advances in the study of protein specific transport and structure in the life sciences [C. Larabell (private communication); W. Meyer-Ilse et al., J. Microsc. 201, 395 (2001)] and the study of magnetic materials [P. Fischer et al., J. Synchrotron. Radiat. 8, 325 (2001)] with elemental sensitivity at the resolution of individual domains. Major corporations (members of the EUV Limited Liability Company are Intel, Motorola, AMD, Micron, Infineon, and IBM) are now preparing the path for the fabrication of future computer chips, in the years 2007 and beyond, using multilayer coated reflective optics, which achieve reflectivities of 70% in the 11–14 nm region [T. Barbee et al., Appl. Opt. 24, 883 (1985); C. Montcalm et al., Proc. SPIE 3676, 710 (1999)]. These coated optics are to be incorporated in extreme ultraviolet (EUV) print cameras, known as “steppers.” Electronic patterns with features in the range of 50–70 nm have been printed. The first alpha tool stepper recently demonstrated all critical technologies [D. Tichenor et al., Proc. SPIE 4343, 19 (2001)] needed for EUV lithography. Preproduction beta tools are targeted for delivery by leading suppliers [ASML, the Netherlands, at the SPIE Microlithography Conference, Santa Clara, CA, March 2001] in 2004, with high volume production tools available in late 2006 for manufacturing in 2007. New results in these two areas will be discussed in the context of the synergy of science and technology. © 2002 American Institute of Physics.
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07.85.Qe Synchrotron radiation instrumentation
07.85.Tt X-ray microscopes
85.40.Hp Lithography, masks and pattern transfer
07.85.Fv X- and γ-ray sources, mirrors, gratings, and detectors

Time-resolved spectroscopy of superconductors using synchrotron infrared pulses (abstract)

G. L. Carr

Rev. Sci. Instrum. 73, 1638 (2002); http://dx.doi.org/10.1063/1.1448130 (1 page) | Cited 1 time

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Infrared synchrotron radiation is a high brightness, pulsed source that enables a variety of novel spectroscopic techniques. One of these is time-resolved, broadband spectroscopy for probing dynamical processes. At the National Synchrotron Light Source (Brookhaven) we have implemented a synchronized laser system for performing pump–probe spectroscopy of superconductors and other materials. In the case of superconductors, we use laser pulses to break Cooper pairs, producing an excess population of quasiparticles. The relaxation (recombination) of this population is then probed with synchrotron infrared pulses, and analyzed in terms of the intrinsic relaxation times for excited quasiparticles and phonons. This presentation will describe the time-resolved technique and results for various metallic and oxide superconductors. © 2002 American Institute of Physics.
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78.47.-p Spectroscopy of solid state dynamics
07.57.Ty Infrared spectrometers, auxiliary equipment, and techniques
74.25.Gz Optical properties
42.72.Ai Infrared sources

Application of polarization modulation spectroscopy to the study of magnetic materials (abstract) (invited)

C. Sanchez-Hanke, D. Lott, J. Stohr, and C.-C. Kao

Rev. Sci. Instrum. 73, 1639 (2002); http://dx.doi.org/10.1063/1.1448131 (1 page)

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Over the last decade, x-ray magnetic circular dichroism (XMCD) and x-ray resonant magnetic scattering (XRMS) have become important experimental techniques in the study of magnetic materials. In order to reduce systematic errors in these measurements, typical XMCD and XRMS experiments are carried out using magnetization switching, although there are many situations where polarization switching is clearly desirable. Recently, fast polarization modulation techniques have been developed using either polarization conversion optical elements, such as phase plate, or special insertion devices. At the National Synchrotron Light Source (NSLS), an elliptically polarized wiggler (EPW), jointly developed by NSLS, Advanced Photon Source, and BINP of Novosibirsk, for this purpose. The EPW consists of a permanent magnet vertical wiggler and an electromagnet horizontal wiggler. The polarization of the device can be switched up to 100 Hz by switching the electromagnet. To take advantage of the fast switching capability, a phase sensitive detection system was also implemented. The sensitivity of using fast polarization modulation is demonstrated by measuring the element specific hysteresis loop and MCD spectrum of Cu induced moment at the interface of a Co/Cu multilayer. By comparing with results obtained using conventional measurements from similar samples, it clearly shows the advantages of using polarization modulation for small MCD effects. The sensitivity of this technique and the possibility of performing magnetic field dependent measurements of using polarization modulation have been applied to a number of magnetic systems. First, the spatial distribution of Cr induced moment in an ideal exchange-biased Fe/Cr multilayer was measured using soft-x-ray XRMS. Specular reflectivity was measured as a function of both angle and energy near Cr and Fe L3 edges. The Cr induced moment was clearly observed. Moreover, the spatial distribution of the induced Cr moment was determined by combining the measurements with detailed simulation of the energy and angle dependent specular reflectivity. Second, the magnetic behavior and spatial distribution of the interfacial Ni spins in an exchange-biased Co/NiO bilayer were studied using angle and energy dependent specular reflectivity as well as total electron yield. These results will be discussed in relation to several existing models of interface spin structures for exchange bias. Other applications of polarization modulation will also be discussed. © 2002 American Institute of Physics.
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75.70.Cn Magnetic properties of interfaces (multilayers, superlattices, heterostructures)
75.25.-j Spin arrangements in magnetically ordered materials (including neutron and spin-polarized electron studies, synchrotron-source x-ray scattering, etc.)

High resolution imaging and lithography with hard x rays using parabolic compound refractive lenses

C. G. Schroer, B. Benner, T. F. Günzler, M. Kuhlmann, C. Zimprich, B. Lengeler, C. Rau, T. Weitkamp, A. Snigirev, I. Snigireva, and J. Appenzeller

Rev. Sci. Instrum. 73, 1640 (2002); http://dx.doi.org/10.1063/1.1445827 (3 pages) | Cited 8 times

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Parabolic compound refractive lenses are high quality optical components for hard x rays. They are particularly suited for full field imaging, with applications in microscopy and x-ray lithography. Taking advantage of the large penetration depth of hard x rays, the interior of opaque samples can be imaged with submicrometer resolution. To obtain the three-dimensional structure of a sample, microscopy is combined with tomographic techniques. In a first hard x-ray lithography experiment, parabolic compound refractive lenses have been used to project the reduced image of a lithography mask onto a resist. Future developments are discussed. © 2002 American Institute of Physics.
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41.50.+h X-ray beams and x-ray optics
42.82.Cr Fabrication techniques; lithography, pattern transfer
42.79.Bh Lenses, prisms and mirrors
07.85.Tt X-ray microscopes
85.40.Hp Lithography, masks and pattern transfer
42.30.Wb Image reconstruction; tomography

Time and phase control of x-rays in stroboscopic diffraction experiments

E. Zolotoyabko and J. P. Quintana

Rev. Sci. Instrum. 73, 1643 (2002); http://dx.doi.org/10.1063/1.1425386 (3 pages) | Cited 1 time

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Time-resolved diffraction experiments with a LiNbO3-based surface acoustic wave (SAW) device were carried out at the 5BMD station of the APS. X-ray diffraction was measured using a 0.58 GHz standing SAW excitation. We observed well-defined diffraction satellites about the main diffraction maximum due to inelastic multiphonon scattering. The satellite intensity oscillated, as a function of the delay time, at 1.16 GHz (i.e., twice the SAW frequency). The maximum satellite contribution reached 40% of the main peak intensity, and proves that the SAW device acts as a fast and effective modulator for coming x-rays. In this study, the phase shift between the x-ray bursts and the acoustic deformation was changed both by electronic delay line (in steps of 18 ps) and by translating the diffractometer along the incident x-ray beam. We demonstrate that the later method can be used to produce very precise delay times in the fs- and ps-scale range. By using a motorized Thomson stage and a laser scan micrometer (Mitutoyo LSM-6000), the translations can be done in steps of 100 nm and monitored with the same precision. The measured positional fluctuations of the diffractometer at rest were within 200–400 nm, which yields the jitter of the corresponding time delay of about 1 fs. © 2002 American Institute of Physics.
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61.05.cp X-ray diffraction
07.85.Jy Diffractometers
63.20.K- Phonon interactions
06.60.Jn High-speed techniques (microsecond to femtosecond)
43.35.Yb Ultrasonic instrumentation and measurement techniques
07.05.Dz Control systems

Solving the crystallographic phase problem with reference-beam diffraction

Qun Shen, Daniel Pringle, Marian Szebenyi, and Jun Wang

Rev. Sci. Instrum. 73, 1646 (2002); http://dx.doi.org/10.1063/1.1445828 (3 pages)

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By using a reference-beam diffraction data-collection technique, it is possible to directly measure a large number of relative phases of Bragg reflections on an area detector in a typical protein crystallography experiment. The technique, being developed at Cornell, incorporates the principle of three-beam diffraction into the most common method of data collection, i.e., the oscillating-crystal method, and allows recordings of many phase-sensitive three-beam interference profiles simultaneously. Recent advances include a dedicated five-circle κ diffractometer and new data acquisition and analysis algorithms. Experimental results on a protein crystal are presented and the strategies of using the measured phases for solving crystal structures are discussed. © 2002 American Institute of Physics.
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61.05.cp X-ray diffraction
61.66.Hq Organic compounds
07.85.Jy Diffractometers

Requirements for x-ray magnetic circular dichroism on paramagnetic biological systems and model compounds

Tobias Funk, Stephan Friedrich, Anthony Young, Elke Arenholz, and Stephen P. Cramer

Rev. Sci. Instrum. 73, 1649 (2002); http://dx.doi.org/10.1063/1.1445829 (3 pages) | Cited 1 time

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We have built an end station for x-ray magnetic circular dichroism (XMCD) measurements on proteins and paramagnetic compounds. Our current setup reaches a base temperature of 2.6 K and magnetic fields up to 6 T and is operated at beamline 4.02 of the Advanced Light Source. In this article we discuss magnetic field and low temperature requirements needed to perform XMCD experiments on magnetically saturated samples. For a typical 3d transition metal paramagnetic system we find that fields above 4 T at a temperature of 2.6 K saturate the magnetization of the sample to more than 80%. We discuss principal considerations for a setup operated at low temperatures on a synchrotron and show that infrared heat shielding is unavoidable to obtain the base temperature at the sample. We show first experimental results from the vanadium (IV) compound VOSO4X[H2O]. © 2002 American Institute of Physics.
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87.64.K- Spectroscopy
07.85.Qe Synchrotron radiation instrumentation
87.14.E- Proteins
07.20.Mc Cryogenics; refrigerators, low-temperature detectors, and other low-temperature equipment

Application of white x-ray microbeams for the analysis of dislocation structures

R. I. Barabash, G. E. Ice, B. C. Larson, and Wenge Yang

Rev. Sci. Instrum. 73, 1652 (2002); http://dx.doi.org/10.1063/1.1445830 (3 pages) | Cited 11 times

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The measurement of dislocation structures on mesoscopic length scales is a particularly important application of white-beam Laue microdiffraction. Near a Bragg reflection the intensity distribution in reciprocal space is sensitive to the organization of the dislocations, which occurs at several structural levels. Unpaired geometrically necessary dislocations (GND) and geometrically necessary boundaries (GNB) result in elongated streaks in the Laue image. The direction of the streaks depends on the average orientation of the dislocation arrays and the diffraction vectors. Laue images collected using synchrotron x-ray microbeams are sensitive to the detailed hierarchical distribution of dislocations and can be used to study the orientation and density of individual GNDs and GNBs. © 2002 American Institute of Physics.
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61.05.cp X-ray diffraction
61.72.Ff Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)

Coherent inelastic Mössbauer scattering of synchrotron radiation (abstract)

V. A. Belyakov

Rev. Sci. Instrum. 73, 1655 (2002); http://dx.doi.org/10.1063/1.1448132 (1 page)

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Recent success of coherent elastic [Nuclear Resonant Scattering of Synchrotron Radiation, Part A edited by E. Gerdau and H. de Woard (Baltzer Science, 2000), Hyperfine Interact. 123/124, Chap. 4] and incoherent inelastic (Hyperfine Interact. 123/124, Chap. 5) Mössbauer scattering of synchrotron radiation (SR) in investigations of very delicate properties of the condensed matter also makes it urgent to perform experiments on coherent inelastic Mössbauer scattering (CIMS) of synchrotron radiation (the common meaning of the term CIMS is coherent inelastic Mössbauer scattering accompanied by creation or annihilation of phonons in the crystal lattice, i.e., by very low energy losses of SR quanta). However up to now there were no publications on experimental observation of CIMS so there is a need in theoretical investigations to reveal the most favorable conditions for CIMS observation. The theory of CIMS is presented below and applied to specific processes of CIMS such as forward scattering, scattering at grazing incidence angles, and scattering via a cascade of Mössbauer transitions. It is shown that the phase matching (between the incident and scattered beam) is very important for the angular and frequency distribution in CIMS and processes where phase matching can be reached, which the best candidates for CIMS experimental investigations. The performed analysis shows that because of the phase matching demands the forward CIMS is suppressed significantly in comparison with the coherent elastic Mössbauer scattering [V. A. Belyakov, JETP Lett. 67, 8 (1998)] and more favorable for observation is CIMS at a nonzero scattering angle. Some examples of CIMS specific geometries are discussed. In particular, it is shown that for the grazing CIMS at isotope interface (a plane interface between regions with different abundance of the Mössbauer isotope) there is enhancement of CIMS at the critical angle of total reflection and suppression of CIMS at angles below the critical one [V. A. Belyakov, JETP Lett. 68, 287 (1998); V. A. Belyakov and S. V. Semenov, JETP 90, 290 (2000)]. Another possibility of CIMS in a more general meaning of the term is Mössbauer scattering of SR via a cascade of Mössbauer transitions (CIMC) which is connected with huge losses of energy by SR quanta in the process [V. A. Belyakov and Yu. M. Aivazian, Nucl. Instrum. Methods, Phys. Res. A 359, 190 (1995); 448, 222 (2000)]. Analysis of CIMC for the two transitions cascade in Fe57 and the corresponding calculations are presented. Optimal conditions of experimental observation for various cases of CIMS are discussed. © 2002 American Institute of Physics.
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76.80.+y Mössbauer effect; other γ-ray spectroscopy
07.85.Qe Synchrotron radiation instrumentation

Development of in situ x-ray tomography-diffraction technique (abstract)

Y. S. Chu, F. De Carlo, J. D. Almer, and D. C. Mancini

Rev. Sci. Instrum. 73, 1656 (2002); http://dx.doi.org/10.1063/1.1448133 (1 page)

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We describe the experimental technique being developed at the bending magnet beamline 2-BM at the Advance Photon Source, which allows in situ measurement of x-ray microtomography and x-ray diffraction. With the combined use of a double crystal monochromator (dE/E ∼ 10−4) and double multilayer monochromator (dE/E ∼ 5×10−2), we have the capacity to make diffraction measurements with high energy resolution and tomography measurements with increased flux. The tomography-diffraction technique has application for studying deformation or fracture process in engineering materials where the measurements both in the real space (e.g., three dimensional mapping of cracks) and in the reciprocal space (e.g., peak shift and broadening due to strain) are extremely valuable. Combining these two complimentary techniques under the same experimental setup can bring the added advantage that both the propagation of cracks and the strains around the cracks can be measured while the specimen is under load. With the high-throughput data acquisition system and a cluster-based parallel computing system, topographic data acquisition and reconstruction of the 512×512×512 voxel sample with a few micron resolution can be obtained in less than 10 min. The x-ray diffraction measurement is performed using a charge coupled device (CCD) camera mounted on two orthogonal linear stages. This offers tracking capability of the diffracted beam to eliminate the systematic errors associated with the measurements of diffraction pattern at fixed distance from the sample. The CCD pixel size of 22.5 μm provides a strain resolution better than 10−4 for most engineering materials. © 2002 American Institute of Physics.
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81.70.-q Methods of materials testing and analysis
61.05.cp X-ray diffraction
07.85.-m X- and γ-ray instruments

Application of absorption and refraction matching techniques for diffraction enhanced imaging

M. Hasnah, O. Oltulu, Z. Zhong, and D. Chapman

Rev. Sci. Instrum. 73, 1657 (2002); http://dx.doi.org/10.1063/1.1445831 (3 pages) | Cited 8 times

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Diffraction enhanced x-ray imaging (DEI) has simultaneous contrast sources from absorption, x-ray refraction gradients, and scatter-rejection (extinction). The combination of these contrast mechanisms generally allows many more features in objects to be observed compared to conventional radiography. In some instances or in specially prepared systems it is possible to eliminate one of the contrast mechanisms so as to create features that arise from a single contrast mechanism. With the DEI technique it is most interesting to either eliminate the absorption contrast of an object or conversely eliminate the refraction gradient contrast. We have explored both extremes of this contrast scale in order to better understand the DEI contrast mechanisms and to exploit the absence of a contrast mechanism for technical purposes. © 2002 American Institute of Physics.
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61.05.cp X-ray diffraction

Effective pinhole-collimated ultrasmall-angle x-ray scattering instrument for measuring anisotropic microstructures

J. Ilavsky, A. J. Allen, G. G. Long, and P. R. Jemian

Rev. Sci. Instrum. 73, 1660 (2002); http://dx.doi.org/10.1063/1.1425387 (3 pages) | Cited 29 times

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Small-angle scattering is widely used for measuring materials microstructure in the 1–100 nm size range. Ultrasmall-angle x-ray scattering (USAXS), typically achieved through crystal collimation, extends this size range to include features over 1 μm in size. This article reports on USAXS on the UNICAT beam line 33-ID at the Advanced Photon Source. The instrument makes use of a six-reflection crystal pair as a collimator and another six-reflection crystal pair as an analyzer. First principle absolute calibration and a broad scattering vector range make this a very effective instrument, limited only by the fact that the measurement of anisotropic microstructures is excluded due to slit smearing from the crystal collimation. This limitation has recently been removed by adding a horizontally reflecting crystal before and another after the sample. This creates a USAXS instrument with collimation in two orthogonal directions. We call this configuration effective pinhole USAXS. Now, anisotropic materials are probed using 9–17 keV photons in the same physically-relevant (from 50 nm to over 1 μm) microstructural size range as that available for materials which scatter isotropically. © 2002 American Institute of Physics.
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61.05.cf X-ray scattering (including small-angle scattering)
07.85.Jy Diffractometers

Energy-tunable x-ray diffraction: A tool for depth profiling in polycrystalline materials

E. Zolotoyabko and J. P. Quintana

Rev. Sci. Instrum. 73, 1663 (2002); http://dx.doi.org/10.1063/1.1425388 (5 pages) | Cited 7 times

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We have developed a new variant of depth-sensitive x-ray diffraction technique to study structural parameters in inhomogeneous polycrystalline materials. In this method, diffraction patterns are measured at different x-ray energies which are varied by small steps, and then the depth-resolved structural characteristics are retrieved from the energy-dependent x-ray diffraction data. In the current articles, this approach is applied to extract preferred orientation with depth resolution. In the case of uniaxial preferred orientation, the analytical algorithm has been developed based on March functions. Application of this technique to seashells allowed us to characterize the microstructure evolution in the nacre layer. Near the inner surface, adjacent to the mollusk mantle, the nacre consists of well-defined lamellas which reveal a high degree of the (001)-preferred orientation. This preferred orientation deteriorates in depth due to the accumulation of cracks and other imperfections. The texture distribution is characterized quantitatively by depth-dependent March parameters, which allows us to compare samples taken from different shells. In a similar way, energy-variable x-ray diffraction can be used for nondestructive characterization of a very broad spectrum of laminated structures and composite materials and systems. © 2002 American Institute of Physics.
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61.05.cp X-ray diffraction
81.70.Jb Chemical composition analysis, chemical depth and dopant profiling

Piezo-XAFS–time-resolved x-ray absorption spectroscopy

Matthias Richwin, Ralf Zaeper, Dirk Lützenkirchen-Hecht, and Ronald Frahm

Rev. Sci. Instrum. 73, 1668 (2002); http://dx.doi.org/10.1063/1.1445832 (3 pages) | Cited 12 times

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The piezo-x-ray absorption spectroscopy technique is a novel tool for time-resolved x-ray absorption spectroscopy in the hard x-ray range. It makes use of piezo tilt tables mounted below the crystals in a double crystal or channel cut crystal monochromator. Repetitive energy scans are performed by applying an oscillatory high voltage to the piezo translators of the tilt tables. Currently, this allows one to scan an energy range of several hundred eV in the hard x-ray range with repetition frequencies of typically 10 Hz. The capability to record full extended x-ray absorption fine structure spectra on a subsecond time scale is demonstrated. © 2002 American Institute of Physics.
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61.05.cj X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc.

Setup for measurements of partial ion yields at the Synchrotron Radiation Center

R. Wehlitz, D. Lukić, C. Koncz, and I. A. Sellin

Rev. Sci. Instrum. 73, 1671 (2002); http://dx.doi.org/10.1063/1.1425389 (3 pages) | Cited 17 times

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A new setup for measuring partial photoion yields was developed and built at the Synchrotron Radiation Center. The vacuum chamber, which accommodates an ion time-of-flight spectrometer, a metal vapor oven, and a liquid nitrogen cooled trap, consists mainly of a standard conflat 6 in. six-way cross and a 6 in. tee. A differential pumping stage separates the vacuum chamber from the beam line. First experiments with this apparatus were performed using neon, lithium, and beryllium. © 2002 American Institute of Physics.
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07.57.-c Infrared, submillimeter wave, microwave and radiowave instruments and equipment
07.60.-j Optical instruments and equipment
07.81.+a Electron and ion spectrometers
32.80.Fb Photoionization of atoms and ions

Synchrotron ultraviolet radiation facility SURF III

U. Arp, C. W. Clark, A. P. Farrell, E. Fein, M. L. Furst, and E. W. Hagley

Rev. Sci. Instrum. 73, 1674 (2002); http://dx.doi.org/10.1063/1.1445833 (3 pages) | Cited 5 times

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The National Institute of Standards and Technology (NIST) has operated the Synchrotron Ultraviolet Radiation Facility (SURF) continuously since the early 1960s. The original accelerator was converted into a storage ring, called SURF II, in 1974. Then in 1998, motivated mainly by limitations in the accuracy of radiometric calibrations and the wish to extend the spectrum of the emitted synchrotron radiation to shorter wavelengths, a second major upgrade was performed. This time the whole magnet system was replaced to improve the calculability and allow for higher magnetic fields. Since the recommissioning of SURF III we have been working to improve the stability of the stored electron beam through modifications of the radio-frequency system, leading to operations with unprecedented stability and new record injection currents topping 700 mA. © 2002 American Institute of Physics.
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29.20.db Storage rings and colliders

Current status of the Synchrotron Radiation Center

C. J. Moore, K. N. Altmann, J. J. Bisognano, R. A. Bosch, D. Eisert, M. Fisher, M. A. Green, R. W. C. Hansen, F. J. Himpsel, H. Höchst, R. L. Julian, K. Kleman, T. Kubala, B. Pedley, G. C. Rogers, et al.

Rev. Sci. Instrum. 73, 1677 (2002); http://dx.doi.org/10.1063/1.1425390 (3 pages) | Cited 1 time

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The Synchrotron Radiation Center operates the Aladdin electron storage ring at energies of 800 meV or 1 GeV in support of a broad range of national and international research programs with a major focus on the study of valence electrons, spectromicroscopy, and nanolithography. Upgrades to the storage ring have improved the stability of the source, and experiments with low emittance lattice configurations show the feasibility of increased brightness for new or enhanced research. Three recently installed undulators, two pure permanent magnet devices and an electromagnetic device, and the associated instrumentation offer experimentalists high flux combined with high resolution. The status of the existing instrumentation, recent scientific results, and an overview of plans for new undulator-based instruments to cover the photon energy range from 7.8 to 400+ eV will be presented. © 2002 American Institute of Physics.
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07.85.Qe Synchrotron radiation instrumentation
29.20.db Storage rings and colliders
41.85.Lc Particle beam focusing and bending magnets, wiggler magnets, and quadrupoles

Status of the Center for Advanced Microstructures and Devices (CAMD)-2001

E. Morikawa, J. D. Scott, J. Goettert, G. Aigeldinger, Ch. S. S. R. Kumar,, B. C. Craft, P. T. Sprunger, R. C. Tittsworth, and F. J. Hormes

Rev. Sci. Instrum. 73, 1680 (2002); http://dx.doi.org/10.1063/1.1425391 (4 pages) | Cited 5 times

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The current status of the Louisiana State University Center for Advanced Microstructures and Devices electron storage ring, beamlines, and the scientific program are described. © 2002 American Institute of Physics.
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07.85.Qe Synchrotron radiation instrumentation
29.20.db Storage rings and colliders
85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
85.40.Hp Lithography, masks and pattern transfer
29.20.-c Accelerators
29.27.-a Beams in particle accelerators
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