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Jan 2001

Volume 72, Issue 1, pp. 1-1261

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back to top OPTICS; ATOMS and MOLECULES; SPECTROSCOPY

Laser-based apparatus for extended ultraviolet femtosecond time-resolved photoemission spectroscopy

P. Siffalovic, M. Drescher, M. Spieweck, T. Wiesenthal, Y. C. Lim, R. Weidner, A. Elizarov, and U. Heinzmann

Rev. Sci. Instrum. 72, 30 (2001); http://dx.doi.org/10.1063/1.1329904 (6 pages) | Cited 39 times

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A novel laser-based apparatus is presented utilizing high harmonic radiation for visible pump–EUV probe experiments on ultrafast processes. True femtosecond temporal resolution is achieved by a monochromator making use of dedicated narrowband multilayer mirrors rather than gratings for selection of single harmonic orders in the photon energy range between 66 and 73 eV. First applications of this new light source for electron spectroscopy on gas phase helium and xenon demonstrate the selection of a single high harmonic order with the intensity ratio between the selected and its adjacent harmonic not exceeding 10:1. A pump–probe study of hot electron production on a solid Pt(110) surface yields a cross-correlation corresponding to a temporal system resolution of 100 fs. © 2001 American Institute of Physics.
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07.81.+a Electron and ion spectrometers
79.60.-i Photoemission and photoelectron spectra
78.47.-p Spectroscopy of solid state dynamics

New picosecond laser system for easy tunability over the whole ultraviolet/visible/near infrared wavelength range based on flexible harmonic generation and optical parametric oscillation

Michael Maus, Els Rousseau, Mircea Cotlet, Gerd Schweitzer, Johan Hofkens, Mark Van der Auweraer, Frans C. De Schryver, and Arnd Krueger

Rev. Sci. Instrum. 72, 36 (2001); http://dx.doi.org/10.1063/1.1326930 (5 pages) | Cited 36 times

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A new laser-based and time-correlated single photon counting (TCSPC) detection system which allows easy and fast tuning of excitation wavelengths over a broad range from 240 to 1300 nm, with small gaps from 335 to 360 nm and 660 to 720 nm, has been built. The unique combination of a mode-locked Ti:sapphire laser, an optical parametric oscillator, pulse selectors, and harmonic generators delivers ultrafast laser pulses (1–2 ps) with variable repetition rates and excitation wavelengths. Performance characteristics of the laser system at different excitation wavelengths are reported and the TCSPC setup, which is characterized by a total instrument response function of 25 ps full width at half maximum, is described. Typical TCSPC measurements demonstrate the capability of the system of deriving decay or species associated excitation spectra. © 2001 American Institute of Physics.
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42.60.By Design of specific laser systems
42.65.Ky Frequency conversion; harmonic generation, including higher-order harmonic generation
42.65.Re Ultrafast processes; optical pulse generation and pulse compression
42.62.Fi Laser spectroscopy
42.65.Yj Optical parametric oscillators and amplifiers
07.57.Ty Infrared spectrometers, auxiliary equipment, and techniques
07.60.Rd Visible and ultraviolet spectrometers
07.57.-c Infrared, submillimeter wave, microwave and radiowave instruments and equipment
07.60.-j Optical instruments and equipment
42.60.Fc Modulation, tuning, and mode locking

Generation of hard x rays by ultrafast terawatt lasers

T. Guo, Ch. Spielmann, B. C. Walker, and C. P. J. Barty

Rev. Sci. Instrum. 72, 41 (2001); http://dx.doi.org/10.1063/1.1327309 (7 pages) | Cited 37 times

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A compact, tabletop terawatt Ti:sapphire laser drive, ultrafast hard x-ray source for time-resolved x-ray diffraction studies is described. With a copper target the energy conversion efficiency from laser photons (800 nm) to copper K x-ray radiation (1.54 Å) is 0.008%. The optimal laser intensity for generating these x rays is 1018 W cm−2, lower than the highest laser intensity available (5×1018 W cm−2) from the laser system. These results are consistent with a theoretical model proposed on the basis that the x rays are produced as a result of laser driven electron ionization of core level electrons of Cu atoms near room temperature. This source also provides features such as ultrashort pulse duration, extremely small source size, variable wavelengths, high peak spectral brightness, and the potential for multiple beam line experiments. X-ray diffraction patterns from GaAs single crystals and amorphous Ni films recorded with this source are presented. © 2001 American Institute of Physics.
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07.85.Fv X- and γ-ray sources, mirrors, gratings, and detectors
61.05.cp X-ray diffraction
52.50.Jm Plasma production and heating by laser beams (laser-foil, laser-cluster, etc.)
42.65.Re Ultrafast processes; optical pulse generation and pulse compression

The effect of unit lens alignment and surface roughness on x-ray compound lens performance

R. H. Pantell, J. Feinstein, H. R. Beguiristain, M. A. Piestrup, C. K. Gary, and J. T. Cremer

Rev. Sci. Instrum. 72, 48 (2001); http://dx.doi.org/10.1063/1.1331326 (5 pages) | Cited 9 times

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The required alignment tolerances and surface roughness for unit lens elements in a compound refractive lens (CRL) for x rays are discussed. Contrary to what one might expect and what has been stated in the patent literature, alignment tolerances are large and for typical parameter values the effect of misalignment is minor. For a parabolic lens the focusing properties of the CRL are unaltered by misalignment and there is a small increase in absorption. For a lens with spherical aberration, there is a slight change in focal length, a minor translation of the image, and a small increase in absorption. This article also shows that lens gain is not appreciably reduced if the phase shift that is introduced by the roughness is limited to ±π/4 or if the transverse period of the roughness exceeds a specified value. The CRL can benefit from a managed misalignment of the elements to reduce the phase error introduced by surface imperfections of the lens. © 2001 American Institute of Physics.
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41.50.+h X-ray beams and x-ray optics
07.85.-m X- and γ-ray instruments
42.79.Bh Lenses, prisms and mirrors

Design and application of a zone plate monochromator for laboratory soft x-ray sources

U. Vogt, M. Wieland, T. Wilhein, M. Beck, and H. Stiel

Rev. Sci. Instrum. 72, 53 (2001); http://dx.doi.org/10.1063/1.1329901 (5 pages) | Cited 3 times

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In this article we describe the test of a zone plate monochromator for a laboratory soft x-ray source which is a laser produced plasma on a liquid jet target. The monochromator consists of a zone plate and a pinhole. Due to the special zone plate used (condensor zone plate KZP7) the monochromator is particularly suitable for laboratory sources since it collects a relatively large solid angle in the present setup. Depending upon the diameter of the pinhole a monochromaticity of up to λ/Δλ=600 can be achieved. The usefulness of the linear monochromator was proven on the basis of a filter transmission measurement. The monochromator can be used for several applications. In particular it is suitable for time-resolved x-ray absorption spectroscopy and pump and probe experiments. The use for such investigations is discussed. © 2001 American Institute of Physics.
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07.85.Fv X- and γ-ray sources, mirrors, gratings, and detectors
07.85.Nc X-ray and γ-ray spectrometers
42.79.Ci Filters, zone plates, and polarizers
52.70.La X-ray and γ-ray measurements

Compact soft x-ray reflectometer based on a line-emitting laser-plasma source

G. A. Johansson, M. Berglund, F. Eriksson, J. Birch, and H. M. Hertz

Rev. Sci. Instrum. 72, 58 (2001); http://dx.doi.org/10.1063/1.1327307 (5 pages) | Cited 7 times

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We describe a compact soft x-ray reflectometer for in-house characterization of water-window multilayer optics. The instrument is based on a line-emitting, liquid-jet, laser-plasma source in combination with angular scanning of the studied multilayer optics. With a proper choice of target liquid and thin-film filters, one or a few lines of well-defined wavelength dominate the spectrum and multilayer periods are measured with an accuracy of 0.003 nm using a multi-line calibration procedure. Absolute reflectivity may also be estimated with the instrument. The typical measurement time is currently 10 min. Although the principles of the reflectometer may be used in the entire soft x-ray and extreme ultraviolet range, the current instrument is primarily directed towards normal-incidence multilayer optics for water-window x-ray microscopy, and is thus demonstrated on W/B4C multilayers for this wavelength range. © 2001 American Institute of Physics.
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07.85.Tt X-ray microscopes
07.85.Fv X- and γ-ray sources, mirrors, gratings, and detectors
52.50.Jm Plasma production and heating by laser beams (laser-foil, laser-cluster, etc.)
42.79.Bh Lenses, prisms and mirrors
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