RSI Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter iResearch App Facebook

BROWSE VOLUMES

Year Range: 
Search Issue | RSS Feeds RSS
Previous Issue Next Issue

May 2000

Volume 71, Issue 5, pp. 1929-2249

Return to All Sections
back to top
RSS Feeds
back to top MICROSCOPY and IMAGING

Highly charged ion based time-of-flight emission microscope

Alex V. Hamza, Alan V. Barnes, Ed Magee, Mike Newman, Thomas Schenkel, Joseph W. McDonald, and Dieter H. Schneider

Rev. Sci. Instrum. 71, 2077 (2000); http://dx.doi.org/10.1063/1.1150582 (5 pages) | Cited 5 times

Full Text: | Download PDF

Show Abstract
An emission microscope using highly charged ions as the excitation source has been designed, constructed, and operated. A novel “acorn” objective lens has been used to simultaneously image electron and secondary ion emission. A resistive anode-position sensitive detector is used to determine the x–y position and time of arrival of the secondary events at the microscope image plane. Contrast in the image can be based on the intensity of the electron emission and/or the presence of particular secondary ions. Spatial resolution of better than 1 μm and mass resolution m/Δm of better than 400 were demonstrated. Background rejection from uncorrelated events of greater than an order of magnitude is also achieved. © 2000 American Institute of Physics.
Show PACS
07.78.+s Electron, positron, and ion microscopes; electron diffractometers

Fuzzy logic algorithm to extract specific interaction forces from atomic force microscopy data

Sandor Kasas, Beat M. Riederer, Stefan Catsicas, Brunero Cappella, and Giovanni Dietler

Rev. Sci. Instrum. 71, 2082 (2000); http://dx.doi.org/10.1063/1.1150583 (5 pages) | Cited 17 times

Full Text: | Download PDF

Show Abstract
The atomic force microscope is not only a very convenient tool for studying the topography of different samples, but it can also be used to measure specific binding forces between molecules. For this purpose, one type of molecule is attached to the tip and the other one to the substrate. Approaching the tip to the substrate allows the molecules to bind together. Retracting the tip breaks the newly formed bond. The rupture of a specific bond appears in the force–distance curves as a spike from which the binding force can be deduced. In this article we present an algorithm to automatically process force–distance curves in order to obtain bond strength histograms. The algorithm is based on a fuzzy logic approach that permits an evaluation of “quality” for every event and makes the detection procedure much faster compared to a manual selection. In this article, the software has been applied to measure the binding strength between tubuline and microtubuline associated proteins. © 2000 American Institute of Physics.
Show PACS
07.79.Lh Atomic force microscopes
34.20.Gj Intermolecular and atom-molecule potentials and forces
07.05.Mh Neural networks, fuzzy logic, artificial intelligence
33.15.Fm Bond strengths, dissociation energies

A metallic microcantilever electric contact probe array incorporated in an atomic force microscope

T. Ondarçuhu, L. Nicu, S. Cholet, C. Bergaud, S. Gerdes, and C. Joachim

Rev. Sci. Instrum. 71, 2087 (2000); http://dx.doi.org/10.1063/1.1150584 (7 pages) | Cited 7 times

Full Text: | Download PDF

Show Abstract
We present the realization and performance of a multiprobe microcontactor made of an array of metallic microcantilevers inserted in an atomic force microscope (AFM). This instrument permits simultaneous AFM imaging and electrical characterization of nanoscale devices. It is therefore well adapted for future generations of molecular devices. The probes are 2-μm-wide metallic cantilevers that are brought in contact with 3 μm×3 μm metallic pads of a nanocircuit using a nanopositioning table. The performance of the instrument, tested on mesoscopic metallic wires and carbon nanotubes, shows that the reproducibility of the electrical contact between the probes and the circuit is better than 99.2%. © 2000 American Institute of Physics.  
Show PACS
07.79.Lh Atomic force microscopes
07.10.Cm Micromechanical devices and systems
84.32.Dd Connectors, relays, and switches

In situ observation of surface deformation of polymer films by atomic force microscopy

Takashi Nishino, Akiko Nozawa, Masaru Kotera, and Katsuhiko Nakamae

Rev. Sci. Instrum. 71, 2094 (2000); http://dx.doi.org/10.1063/1.1150585 (3 pages) | Cited 11 times

Full Text: | Download PDF

Show Abstract
The tensile X–Y stage, providing a load cell and a stretching device, has been constructed to observe the surface deformation of polymer film in situ by using an atomic force microscope (AFM). From the three-dimensional AFM images, the streak-like bumps were observed on a polyethylene terephalate (PET) film surface. By monitoring the change in the distance between them by the tensile load, the strain was evaluated in the direction both parallel and perpendicular to the tensile direction. The microscopic stress–strain relationship by AFM coincided with the macroscopic one, which indicates so-called affine deformation of PET film. Young’s modulus was obtained as 2.3 GPa for PET from the initial slope of the stress–strain curve by AFM. The apparent Poisson ratio of the PET film surface could be also evaluated. © 2000 American Institute of Physics.
Show PACS
68.35.Gy Mechanical properties; surface strains
61.41.+e Polymers, elastomers, and plastics
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
62.20.F- Deformation and plasticity
62.20.D- Elasticity

High-speed atomic force microscopy in liquid

T. Sulchek, R. Hsieh, J. D. Adams, S. C. Minne, C. F. Quate, and D. M. Adderton

Rev. Sci. Instrum. 71, 2097 (2000); http://dx.doi.org/10.1063/1.1150586 (3 pages) | Cited 41 times

Full Text: | Download PDF

Show Abstract
High-speed constant force imaging with the atomic force microscope (AFM) has been achieved in liquid. By using a standard optical lever AFM, and a cantilever with an integrated zinc oxide (ZnO) piezoelectric actuator, an imaging bandwidth of 38 kHz has been achieved; nearly 100 times faster than conventional AFMs. For typical samples, this bandwidth corresponds to tip velocities in excess of 3 mm/s. High-speed AFM imaging in liquid will (1) permit chemical and biological AFM observations to occur at speeds previously inaccessible, and (2) significantly decrease measurement times in standard AFM liquid operation. © 2000 American Institute of Physics.
Show PACS
07.79.Lh Atomic force microscopes
87.64.Dz Scanning tunneling and atomic force microscopy

Construction and characterization of a heating stage for a scanning probe microscope up to 215 °C

Z. Xie, E. Z. Luo, J. B. Xu, I. H. Wilson, L. H. Zhao, and X. X. Zhang

Rev. Sci. Instrum. 71, 2100 (2000); http://dx.doi.org/10.1063/1.1150587 (4 pages) | Cited 7 times

Full Text: | Download PDF

Show Abstract
In this article, we present a study on construction and characterization of a heating stage compatible to commercially available scanning probe microscopes working in contact and tapping modes. Thermal properties of the heating stage have been characterized. With the heating stage, sample surface temperature can reach as high as 215 °C while the scanner temperature is kept below 125 °C. Below 50 °C, the stage temperature is very stable, with fluctuations less than 0.05 °C within half an hour. In both the contact and tapping mode of the force microscope, the image distortions have been calibrated, which occurs due to the decrease of piezoelectric coefficient at high temperature. It has been found that a cork wood spacer is excellent for thermal isolation to prevent the scanner from overheating. Examples of applications of the heating stage will be presented and discussed. © 2000 American Institute of Physics.
Show PACS
07.79.-v Scanning probe microscopes and components
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
07.20.Hy Furnaces; heaters
Return to All Sections
Close

Google Calendar

ADVERTISEMENT

Go to AIP Home   © AIP Publishing LLC
close