RSI Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter iResearch App Facebook

BROWSE VOLUMES

Year Range: 
Search Issue | RSS Feeds RSS
Previous Issue Next Issue

Feb 2000

Volume 71, Issue 2, pp. 335-1239

Return to All Sections
back to top
RSS Feeds

Ion source of multiply charged C60 fullerene and fullerene linear accelerator

Toshiyuki Hattori, Noriyosu Hayashizaki, Shinjirou Matsui, Hiromitsu Tomizawa, Toru Yoshida, Stephen John Gates, Kimikazu Sasa, Satoshi Majima, Katsushi Isokawa, Takashi Ito, Masahiro Okamura, and Satoru Yamada

Rev. Sci. Instrum. 71, 1049 (2000); http://dx.doi.org/10.1063/1.1150383 (3 pages) | Cited 2 times

Full Text: | Download PDF

Show Abstract
Production and acceleration system of multiply charged C60 and C70 fullerene ions are being designed for basic studies on cluster physics. Multiply charged fullerene ions are produced by electron impacts. Ions selected by the analyzing magnet are accelerated up to 100 kV through an acceleration column. The ion source generates C60+(8.4 nA), C602+(4.5 nA), C603+(1.6 nA). C60+, C602+, and C603+ are accelerated up to 100, 200, and 300 keV, respectively. The alternating phase focus (APF)-interdigital H-mode (IH) linac was designed to accelerate C60+ ion (ϵ = 1/720) and C70+ ion (ϵ = 1/840) from 0.2 to 3.2 keV/amu with an APF and an operation frequency of 10 MHz. © 2000 American Institute of Physics.
Show PACS
29.25.Ni Ion sources: positive and negative
07.77.Ka Charged-particle beam sources and detectors
29.20.-c Accelerators
36.40.Wa Charged clusters

Effects of indirect ionization on the charge state distributions observed with highly charged ion sources

M. P. Stockli, U. Lehnert, R. Becker, O. Delferriere, Th. Gebel, F. Ullmann, N. Kobayashi, and J. Matsumoto

Rev. Sci. Instrum. 71, 1052 (2000); http://dx.doi.org/10.1063/1.1150384 (4 pages)

Full Text: | Download PDF

Show Abstract
Presently, most charge state distributions produced with highly charged ion sources are predicted with models that approximate the ionization process with the Lotz formula. The Lotz ionization cross sections decrease approximately geometrically with increasing charge state except for ions with very few vacancies, for ions with very few electrons, and for electron impact energies which barely exceed the ionization energy. The geometrical decrease causes these models to predict a maximum abundance for most of the charge states, which is only weakly dependent on the charge state. Experimental results, however, yield much higher abundances for ions with an empty M shell than ions with a partly filled M shell. This difference is explained with indirect ionization processes that are neglected by the Lotz approximation, and normally can be neglected for the ionization of the L shell, but can dominate the ionization of the M shell. © 2000 American Institute of Physics.
Show PACS
07.77.Ka Charged-particle beam sources and detectors
29.25.Ni Ion sources: positive and negative
Return to All Sections
Close

Google Calendar

ADVERTISEMENT

Go to AIP Home   © AIP Publishing LLC
close