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Sep 1999

Volume 70, Issue 9, pp. 3515-3781

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back to top OPTICS; ATOMS and MOLECULES; SPECTROSCOPY

Laser power build-up cavity for high-resolution laser spectroscopy

J. A. Barnes, T. E. Gough, and M. Stoer

Rev. Sci. Instrum. 70, 3515 (1999); http://dx.doi.org/10.1063/1.1149952 (4 pages) | Cited 8 times

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The design, construction, and operation of an optical build-up cavity (BUC) designed primarily for use in molecular beam laser spectroscopy where signal is proportional to laser power, is presented. The design is such that the cavity has no internal adjustment controls, needing only alignment with respect to the laser and molecular beams. When used with a single-mode titanium:sapphire laser, a circulating cw power of 900 W was achieved. The BUC increased the signal to noise of the experiment by a factor of 390 relative to a single crossing of laser and molecular beam without degrading resolution. Performance of the BUC is limited by heating of its mirrors by the high power densities incident upon them (∼3 MW cm−2). © 1999 American Institute of Physics.
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07.57.-c Infrared, submillimeter wave, microwave and radiowave instruments and equipment
07.60.-j Optical instruments and equipment
42.60.Da Resonators, cavities, amplifiers, arrays, and rings
42.62.Fi Laser spectroscopy
07.57.Ty Infrared spectrometers, auxiliary equipment, and techniques
07.60.Rd Visible and ultraviolet spectrometers

Design of a low-cost detection system for laser-induced plasma spectroscopy

R. E. Neuhauser, B. Ferstl, C. Haisch, U. Panne, and R. Niessner

Rev. Sci. Instrum. 70, 3519 (1999); http://dx.doi.org/10.1063/1.1149953 (4 pages) | Cited 6 times

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A low-cost detection system for laser-induced plasma spectroscopy (LIPS) is described. The system comprises a Rowland spectrometer with photomultiplier detection and a miniaturized multiple gated integrator system. The sensitivity and the spectral band pass of the system were characterized and compared to a conventional Czerny–Turner system with an intensified diode array detector for chromium as representative analyte. Both, the sensitivity and spectral resolution were found to be sufficient for the intended simultaneous multielement LIPS analysis of simple and constant matrices. © 1999 American Institute of Physics.
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82.80.Ms Mass spectrometry (including SIMS, multiphoton ionization and resonance ionization mass spectrometry, MALDI)
42.62.Fi Laser spectroscopy
07.60.Rd Visible and ultraviolet spectrometers
85.60.Gz Photodetectors (including infrared and CCD detectors)
07.05.Hd Data acquisition: hardware and software

New mounting method of diamond monochromator for high brilliance synchrotron radiation

Toshio Takiya, Hiroshi Sugiyama, Xiaowei Zhang, Shoichi Shimada, Kunihiko Yamazato, Akio Komura, and Masami Ando

Rev. Sci. Instrum. 70, 3523 (1999); http://dx.doi.org/10.1063/1.1149954 (6 pages) | Cited 1 time

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We have studied a new and reliable cooling method for diamond crystals in third generation light sources. In order to reduce the strain from brazing between the diamond monochromator and its Cu block cooling device, another diamond platelet was introduced as an interface. Using a finite element method program based on numerical thermal analysis, the mounting strain was estimated at 0.6 arcsec. Then data was confirmed through preliminary x-ray characterization using laboratory x-ray sources. The strain in the area exposed to a 1 mm×4 mm synchrotron radiation beam (absorbed power 100 W) was estimated by simulation at an acceptable 1.0 arcsec. Applying the new cooling method, the diamond crystal can tolerate synchrotron radiation power up to 100 W. © 1999 American Institute of Physics.
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07.85.Qe Synchrotron radiation instrumentation

A study on background subtraction in Auger and photoelectron time coincidence spectroscopy using third generation synchrotron radiation source

P. Calicchia, S. Lagomarsino, F. Scarinci, C. Martinelli, and V. Formoso

Rev. Sci. Instrum. 70, 3529 (1999); http://dx.doi.org/10.1063/1.1149955 (8 pages) | Cited 2 times

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Auger and photoelectron time coincidence spectroscopy measurements on Si(100) have been carried out employing third generation synchrotron radiation source. This work has been focused on the particular treatment of the collected data required for this kind of experiment. The time structure characteristics of the European Synchrotron Radiation Facility light source have been taken into account in time coincidence data analysis, and compared with other sources. This study has shown the particular influence of the source in the distribution of accidental coincident events, revealing the need to introduce a suitable method for background subtraction in coincidence spectra. © 1999 American Institute of Physics.
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07.81.+a Electron and ion spectrometers
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Development of zone plates with a blazed profile for hard x-ray applications

W. Yun, B. Lai, A. A. Krasnoperova, E. Di Fabrizio, Z. Cai, F. Cerrina, Z. Chen, M. Gentili, and E. Gluskin

Rev. Sci. Instrum. 70, 3537 (1999); http://dx.doi.org/10.1063/1.1149956 (5 pages) | Cited 20 times

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A linear and a circular zone plate with a blazed zone profile (ZPBP) have been fabricated and characterized using synchrotron x rays. The ZPBPs have significantly improved performances in terms of focusing efficiency and the background near the focus compared to those of a zone plate with a square profile, of which the transmission function can be characterized by a binary square wave. In many respects and practical cases, an x-ray ZPBP may be used in a way analogous to an optical lens in the visible light region. In this article, the experimental characterization of the ZPBPs is presented and some special applications are discussed. © 1999 American Institute of Physics.
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07.85.Fv X- and γ-ray sources, mirrors, gratings, and detectors
42.79.Ci Filters, zone plates, and polarizers
07.85.Qe Synchrotron radiation instrumentation

Thermal tuning of a fiber-optic interferometer for maximum sensitivity

K. J. Bruland, J. L. Garbini, W. M. Dougherty, S. H. Chao, S. E. Jensen, and J. A. Sidles

Rev. Sci. Instrum. 70, 3542 (1999); http://dx.doi.org/10.1063/1.1149947 (3 pages) | Cited 23 times

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We describe a fiber-optic interferometer that employs wavelength changes to achieve maximum sensitivity. Wavelength changes are induced by adjusting the operating temperature of the laser, eliminating the need for an actuator to vary the spacing between the sensing fiber and the object to be monitored. The instrument and techniques described are suitable for cryogenic, high vacuum applications such as magnetic resonance force microscopy, where space is limited and micromanipulation can be challenging. The noise floor of 1.6×10−3 nm/math is adequate for monitoring subangstrom displacement of force microscope cantilevers. © 1999 American Institute of Physics.
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07.60.Vg Fiber-optic instruments
07.60.Ly Interferometers
42.81.Pa Sensors, gyros
07.79.Pk Magnetic force microscopes
06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
42.60.Fc Modulation, tuning, and mode locking

Cylindrical compound refractive x-ray lenses using plastic substrates

J. T. Cremer, M. A. Piestrup, H. R. Beguiristain, C. K. Gary, R. H. Pantell, and R. Tatchyn

Rev. Sci. Instrum. 70, 3545 (1999); http://dx.doi.org/10.1063/1.1149957 (4 pages) | Cited 10 times

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We have measured the intensity profile of x rays focused by compound refractive lenses (CRLs) fabricated using acrylic (Lucite) and polyethylene plastics. A linear array of closely spaced holes acts as multiple cylindrical lenses. The important parameters for this type of focusing are the focal length and absorption, and, for wavelengths shorter than 3 Å, low atomic number plastics are suitable. We have experimentally demonstrated that we can achieve one-dimensional focusing for photon energies between 9 and 19.5 keV with focal lengths between 20 and 100 cm. For example, using 12 keV x rays we have achieved focal full width at half maximum linewidths down to 21 μm at a distance of only 20 cm from the CRL. The x-ray source was a synchrotron emitter whose source size in the vertical dimension was 445 μm. © 1999 American Institute of Physics.
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07.85.Qe Synchrotron radiation instrumentation
42.79.Bh Lenses, prisms and mirrors

Spectral response measurements of an x-ray sensor camera by a fluorescence wavelength dispersive spectrometer

J. M. Wulveryck and D. Mouze

Rev. Sci. Instrum. 70, 3549 (1999); http://dx.doi.org/10.1063/1.1149958 (5 pages) | Cited 2 times

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Measurements of the spectral efficiency of an x-ray camera in the 5–25 keV range are presented. The camera consists of a slow scan transfer device (a charge coupled device) optically coupled to a scintillator screen (Y2O2S:Eu). A straightforward method, using laboratory x-ray sources, allows one to carry out measurements in a larger energy range, typically from a few keV to tens of keV by means of a fluorescence wavelength dispersive spectrometer. The spectral responsivity of the x-ray imaging detector, in units of analog-to-digital converter in keV, is discussed. In particular, the assumption of a linear conversion from incident x-ray energy to visible photon energy is confirmed by the experiment. © 1999 American Institute of Physics.
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07.85.Tt X-ray microscopes
85.60.Gz Photodetectors (including infrared and CCD detectors)
82.80.Ej X-ray, Mössbauer, and other γ-ray spectroscopic analysis methods

New high temperature furnace for structure refinement by powder diffraction in controlled atmospheres using synchrotron radiation

L. Margulies, M. J. Kramer, R. W. McCallum, S. Kycia, D. R. Haeffner, J. C. Lang, and A. I. Goldman

Rev. Sci. Instrum. 70, 3554 (1999); http://dx.doi.org/10.1063/1.1149948 (8 pages) | Cited 28 times

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A low thermal gradient furnace design is described which utilizes Debye–Scherrer geometry for performing high temperature x-ray powder diffraction with synchrotron radiation at medium and high energies (35–100 keV). The furnace has a maximum operating temperature of 1800 K with a variety of atmospheres including oxidizing, inert, and reducing. The capability for sample rotation, to ensure powder averaging, has been built into the design without compromising thermal stability or atmosphere control. The ability to perform high-resolution Rietveld refinement on data obtained at high temperatures has been demonstrated, and data collected on standard Al2O3 powder is presented. Time-resolved data on the orthorhombic to rhombohedral solid state phase transformation of SrCO3 is demonstrated using image plates. Rietveld refinable spectra, collected in as little as 8 s, opens the possibility of performing time-resolved structural refinements of phase transformations. © 1999 American Institute of Physics.
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07.85.Jy Diffractometers
61.05.cp X-ray diffraction
07.20.Hy Furnaces; heaters
07.85.Qe Synchrotron radiation instrumentation

A micromechanical detector for molecular beams

Adrian Wicki, Vittorio Marsico, Klaus Kuhnke, Klaus Kern, Lionel Paratte, Sandra Schweizer, and Philippe Renaud

Rev. Sci. Instrum. 70, 3562 (1999); http://dx.doi.org/10.1063/1.1149959 (4 pages) | Cited 1 time

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We demonstrate the detection of a molecular beam by means of a micromechanical momentum transfer detector operated in vibrational resonance. With a sensitive surface area of 0.5×0.3 mm2 the small paddle allows us to detect a beam with 6.5×107 He atoms hitting the surface per second. The detector response time equals the damping time of the paddle oscillation of about 1 s. The detector is sensitive enough to measure intensities in molecular beam scattering experiments. The novel detection scheme has the potential to allow the development of a position sensitive molecular beam detector. © 1999 American Institute of Physics.
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07.77.Gx Atomic and molecular beam sources and detectors
37.20.+j Atomic and molecular beam sources and techniques
07.10.Cm Micromechanical devices and systems
34.35.+a Interactions of atoms and molecules with surfaces
79.20.Rf Atomic, molecular, and ion beam impact and interactions with surfaces
back to top CHARGED PARTICLE SOURCES, OPTICS and ACCELERATION

Nonlinear field effects in quadrupole mass filters

J. Schulte, P. V. Shevchenko, and A. V. Radchik

Rev. Sci. Instrum. 70, 3566 (1999); http://dx.doi.org/10.1063/1.1149960 (6 pages) | Cited 9 times

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The performance of a quadrupole mass filter (QMF) generally degrades when using electrodes of circular cross section in place of mathematical ideal hyperbolic electrodes. The circular cross section of electrodes produces nonlinear resonances resulting in distortion and peak splitting in mass spectra. In addition, resonances reduce the actual working cross section, resulting in limited ion yield. In this article we study nonlinear resonances and intensities of resonance lines passing through the tip of the stability diagram of the QMF. We have found that balancing of multipole terms, rather than eliminating individual multipole terms, improves the sensitivity of the QMF considerably. The theory for assessing intensities of nonlinear resonances is presented in detail along with rescaling laws to adjust current QMF parameter settings. A general formula is presented from which the location and intensity of nonlinear can be derived, which then may be used for the design of special purpose QMFs. © 1999 American Institute of Physics.
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07.75.+h Mass spectrometers

A novel electron spin-polarization detector with very large analyzing power

Riccardo Bertacco, Davide Onofrio, and Franco Ciccacci

Rev. Sci. Instrum. 70, 3572 (1999); http://dx.doi.org/10.1063/1.1149961 (5 pages) | Cited 11 times

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The low energy electron reflectivity from a magnetic surface depends on the relative orientation between the electron spin and the sample magnetization. This effect has been exploited for realizing a new electron spin polarization detector. As a scattering surface we have used a well ordered Fe(001)-p(1×1)O surface, which is stable against surface contamination and gives rise to very large spin dependent effects. We describe in detail the preparation in vacuum of such a target surface and show that it can be transferred in a separate system, without performance losses. The analyzing power S of the detector is given by the relative variation of its response when the target magnetization is reversed. We find extremely large S values for electrons reflected at 3–6 eV kinetic energy, with maximum above 45%, i.e., roughly 3 times better than other polarimeters presently used. © 1999 American Institute of Physics.
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07.81.+a Electron and ion spectrometers
79.20.Kz Other electron-impact emission phenomena
75.70.Rf Surface magnetism

18 GHz upgrading of the superconducting electron cyclotron resonance ion source SERSE

S. Gammino, G. Ciavola, L. Celona, M. Castro, F. Chines, and S. Marletta

Rev. Sci. Instrum. 70, 3577 (1999); http://dx.doi.org/10.1063/1.1149962 (6 pages) | Cited 14 times

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The superconducting electron cyclotron resonance ion source SERSE of INFN-Laboratori Nazionali del Sud has been recently upgraded with an 18 GHz generator which takes the place of the 14.5 GHz generator, used up to now. In order to further extend the validation of high B mode to higher frequency, some comparative tests have also been carried out, aimed at understanding the role of the magnetic field and frequency on the ion yield at higher levels than were ever done before. The results at the frequencies of 14.5 and 18 GHz are compared and the trend already observed elsewhere is here confirmed. Preliminary observations of the “two frequency heating” have contributed to increase further the currents of the highest charge states. © 1999 American Institute of Physics.
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07.77.Ka Charged-particle beam sources and detectors
29.25.Ni Ion sources: positive and negative
84.71.Ba Superconducting magnets; magnetic levitation devices
52.50.Dg Plasma sources
52.55.Lf Field-reversed configurations, rotamaks, astrons, ion rings, magnetized target fusion, and cusps
back to top NUCLEAR PHYSICS, FUSION and PLASMAS

Unipolar arc simulation device

S. G. Wang and I. G. Brown

Rev. Sci. Instrum. 70, 3583 (1999); http://dx.doi.org/10.1063/1.1149963 (3 pages) | Cited 3 times

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We describe a simple laboratory device for establishing a vacuum arc plasma discharge that can serve to simulate a unipolar arc. The technique makes use of a triggered vacuum arc plasma gun to generate a plasma plume that in turn causes breakdown of a secondary discharge. The device is in fact a secondary vacuum arc discharge that is triggered by a primary vacuum arc discharge, with some of the features of the secondary plasma discharge having similarities with a unipolar arc configuration. Here we describe the experimental setup and outline how the device can be used for some areas of unipolar arc materials research. © 1999 American Institute of Physics.
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52.80.Mg Arcs; sparks; lightning; atmospheric electricity
52.80.Vp Discharge in vacuum
52.75.-d Plasma devices
back to top BASIC PHENOMENA

Measurement of the thermoelectric power of very small samples at ambient and high pressures

D. A. Polvani, J. F. Meng, M. Hasegawa, and J. V. Badding

Rev. Sci. Instrum. 70, 3586 (1999); http://dx.doi.org/10.1063/1.1149964 (4 pages) | Cited 23 times

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There is currently much interest in the thermoelectric properties of materials. A method for measuring the thermoelectric power of small single-crystal or polycrystalline samples is described. For high-pressure measurements, the small samples are loaded into a diamond anvil cell and compressed. An infrared laser system is used to induce a temperature gradient in the sample. The thermoelectric power is measured with a pair of small thermocouples contacting the sample. Reported here is the thermoelectric power of Ni and the previously reported intermetallic compound CePd3 up to 10 GPa. Other standards measured by this method included: Bi, Yb, and CeSn3. © 1999 American Institute of Physics.
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84.37.+q Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)
07.35.+k High-pressure apparatus; shock tubes; diamond anvil cells
06.20.F- Units and standards
72.15.Jf Thermoelectric and thermomagnetic effects

Investigation of a microwave differential cavity resonator device for the measurement of humidity in gases

J. F. Rouleau, J. Goyette, T. K. Bose, and M. F. Fréchette

Rev. Sci. Instrum. 70, 3590 (1999); http://dx.doi.org/10.1063/1.1149995 (5 pages) | Cited 4 times

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A resonant cavity based microwave differential device has been developed as a sensor for the measurement of small quantities of water vapor in gases. The presence of a contaminant is assessed by induced variations in the relative permittivity due to a shift in the resonant frequency of the measuring resonator. The measured output signal is related to the difference in the reflection coefficients of the measuring resonator and the reference one. A simple modeling approach of the system shows the proportionality between the difference of the reflection coefficients of the cavities and the variation in the dielectric constant. The evaluation of the minimum detectable change in the permittivity is possible using the Clausius–Mossotti equation for a binary gas mixture at a given concentration and pressure. The detection threshold is then determined by taking into account the signal-to-noise ratio of the differential setup. The estimation of the limit of detection for some practical moisture contaminated gases yields values in the low ppm level at T = 293 K and atmospheric pressure. Experimental data suggest a detection threshold of 6 ppm for moisture. © 1999 American Institute of Physics.
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07.07.Vx Hygrometers; hygrometry
84.40.Az Waveguides, transmission lines, striplines
07.68.+m Photography, photographic instruments; xerography
back to top MICROSCOPY and IMAGING

Multichannel time-resolved optical tomographic imaging system

Hideo Eda, Ichiro Oda, Yasunobu Ito, Yukihisa Wada, Yukio Oikawa, Yoshio Tsunazawa, Michinosuke Takada, Yutaka Tsuchiya, Yutaka Yamashita, Motoki Oda, Angelo Sassaroli, Yukio Yamada, and Mamoru Tamura

Rev. Sci. Instrum. 70, 3595 (1999); http://dx.doi.org/10.1063/1.1149965 (8 pages) | Cited 83 times

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A time-resolved optical imaging system using near-infrared light has been developed. The system had three pulsed light sources and total 64 channels of detection, working simultaneously for acquisition of the time-resolved data of the pulsed light transmitted through scattering media like biological tissues. The light sources were provided by high power picosecond pulsed diode lasers, and optical switches directed one of the light sources to the object through an optical fiber. The light signals reemitted from the surface of the object were collected by optical fibers, and transmitted to a time-resolved detecting system. Each of the detecting channels consisted of an optical attenuator, a fast photomultiplier, and a time-correlated single photon counting circuit which contained a miniaturized constant fraction discriminator/time-to-amplitude converter module, and a signal acquisition unit with an A/D converter. The performance and potentiality of the imaging system have been examined by the image reconstruction from the measured data using solid phantoms. © 1999 American Institute of Physics.
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87.63.L- Visual imaging
42.30.Wb Image reconstruction; tomography
87.63.-d Non-ionizing radiation equipment and techniques
87.57.N- Image analysis
42.62.Be Biological and medical applications
07.05.Pj Image processing

High resolution photothermal imaging of high frequency phenomena using a visible charge coupled device camera associated with a multichannel lock-in scheme

S. Grauby, B. C. Forget, S. Holé, and D. Fournier

Rev. Sci. Instrum. 70, 3603 (1999); http://dx.doi.org/10.1063/1.1149966 (6 pages) | Cited 37 times

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We have developed a technique using a photothermal microscope from which we can make a thermal image of an electronic component working at a “high frequency” using a charge coupled device (CCD) camera and a multichannel lock-in scheme. To do this, we have created an electronic “stroboscope”: the frequency F of the thermal signal induced by a high frequency electrical excitation and the frequency of the light F+f that illuminates the device are next to each other; the signal reflected at the surface of the device whose amplitude is proportional to the variation of reflectivity and hence to the variation of temperature and whose frequency is the blinking one f is analyzed by a visible CCD camera. Amplitude and phase images of the high frequency thermal phenomenon can then be made. Moreover, this technique presents a great advantage: the spatial resolution is better than 1 μm. The amplitude and phase images presented show, with a very good spatial resolution, Joule and Peltier heating of a polycrystalline silicon 2.5 kΩ resistor across which a sinusoidal current is forced. © 1999 American Institute of Physics.
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07.20.-n Thermal instruments and apparatus
42.79.Pw Imaging detectors and sensors
07.60.Pb Conventional optical microscopes
42.30.Va Image forming and processing

Tip-sample interaction in a “shear-force” near-field scanning optical microscope

Kate Hsu and Levi A. Gheber

Rev. Sci. Instrum. 70, 3609 (1999); http://dx.doi.org/10.1063/1.1149967 (5 pages) | Cited 19 times

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The interaction between the tip of a near-field scanning optical microscope (NSOM) and the sample it scans is analyzed and compared to a simple tapping model. The approach curves acquired with the NSOM are in excellent agreement with the model, and additional experiments strongly point against a noncontact interaction (such as shear force). Based on this model we are also able to explain the oscillations pattern of the feedback loop. We conclude that our straight-fiber tip, operating under “shear-force” control, intermittently contacts the surface it is scanning, in a way similar to the tapping mode in atomic force microscope. © 1999 American Institute of Physics.
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07.79.Fc Near-field scanning optical microscopes
07.60.Vg Fiber-optic instruments
07.07.Tw Servo and control equipment; robots

Fast low-cost phase detection setup for tapping-mode atomic force microscopy

M. Stark and R. Guckenberger

Rev. Sci. Instrum. 70, 3614 (1999); http://dx.doi.org/10.1063/1.1149968 (6 pages) | Cited 12 times

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A fast low-cost device to detect the phase shift between the excitation and the response of a cantilever in tapping-mode atomic force microscopy is described. For cantilever signals with a good signal to noise ratio, as is commonly found, the device presented can replace a lock-in amplifier. The setup is based on indirect time measurements realized by a combination of commonly used analog and digital integrated circuits. Phase measurement can already be achieved within one cycle. Signal output rates up to 100 kHz allow the use of the phase shift as an auxiliary imaging channel. Cantilever frequencies may range from 6 to more than 500 kHz. The principle of the setup is illustrated together with technical data. Images of a hydrophobic–hydrophilic structured silicon surface obtained in air and of purple membrane obtained in fluid are presented. © 1999 American Institute of Physics.
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07.79.Lh Atomic force microscopes
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
87.64.Dz Scanning tunneling and atomic force microscopy
07.68.+m Photography, photographic instruments; xerography
68.35.B- Structure of clean surfaces (and surface reconstruction)
84.30.Qi Modulators and demodulators; discriminators, comparators, mixers, limiters, and compressors
84.30.Sk Pulse and digital circuits

Monitoring of an atomic force microscope cantilever with a compact disk pickup

F. Quercioli, B. Tiribilli, C. Ascoli, P. Baschieri, and C. Frediani

Rev. Sci. Instrum. 70, 3620 (1999); http://dx.doi.org/10.1063/1.1149969 (5 pages) | Cited 15 times

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In the present study we test a compact disk pickup as the cantilever position sensor in an atomic force microscope (AFM). The pickup is placed on top of the optical microscope used for the visual inspection and alignment of the specimen. The AFM is also equipped with its own cantilever movement sensor system. Both the built-in and the new detection devices are simultaneously active for comparison purposes. Two different measurements are performed in sequence on the same sample each using one sensor at a time as the error signal source for the AFM feedback loop. The pickup has demonstrated good sensitivity as well as excellent performance in terms of compactness, reliability, and cost. © 1999 American Institute of Physics.
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07.79.Lh Atomic force microscopes
06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
43.38.Md Sound recording and reproducing systems, general concepts

A low temperature ultrahigh vaccum scanning force microscope

Hans J. Hug, B. Stiefel, P. J. A. van Schendel, A. Moser, S. Martin, and H.-J. Güntherodt

Rev. Sci. Instrum. 70, 3625 (1999); http://dx.doi.org/10.1063/1.1149970 (16 pages) | Cited 64 times

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This article describes the design of a versatile ultrahigh vaccum (UHV) low temperature scanning force microscope system. The system allows scanning probe microscopy measurements at temperatures between 6 and 400 K and in magnetic fields up to 7 T. Cantilevers and samples can be prepared in UHV and transferred to the microscope. We describe some technical details of our system and present first measurements performed at different temperatures and in various scanning force microscopy operation modes. We demonstrate distortion free and calibrated images at temperatures ranging from 8 to 300 K, atomic resolution on NaCl at 7.6 K and various magnetic force microscopy images of vortices in high transition temperature superconductors. It is demonstrated that our instrumentation reaches the thermodynamically determined sensitivity limit. Using standard cantilevers force gradients in the 10−6N/m range, corresponding forces of about 10−15N can be measured. © 1999 American Institute of Physics.
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07.79.Lh Atomic force microscopes
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
68.35.B- Structure of clean surfaces (and surface reconstruction)
07.79.Pk Magnetic force microscopes
07.20.Mc Cryogenics; refrigerators, low-temperature detectors, and other low-temperature equipment
07.30.Kf Vacuum chambers, auxiliary apparatus, and materials

A new and sophisticated electrochemical scanning tunneling microscope design for the investigation of potentiodynamic processes

M. Wilms, M. Kruft, G. Bermes, and K. Wandelt

Rev. Sci. Instrum. 70, 3641 (1999); http://dx.doi.org/10.1063/1.1149971 (10 pages) | Cited 43 times

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One of the main topics in electrochemistry is the investigation of the potential controlled solid/liquid interface. As a local probe technique electrochemical scanning tunneling microscopy becomes more and more important for the analysis of atomic structures and local structuring effects. The described microscope is optimized for potentiodynamic imaging, i.e., the sample potential can be varied in a wide range during the scan of an image. In combination with cyclic voltammetry potential induced phase transitions on the surface can be imaged and directly correlated to distinctive profiles in the simultaneously recorded voltammogram. The new design grew out of the parallel development of the tunneling unit and the electrochemical periphery. This guarantees the best adaptation of tunneling microscopy to electrochemistry and vice versa. Low drift, high resolution, flexibility, reliability, and ease of handling are the characteristics of the new instrument. © 1999 American Institute of Physics.
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07.79.Cz Scanning tunneling microscopes
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
82.80.Fk Electrochemical methods
82.45.-h Electrochemistry and electrophoresis
07.07.Tw Servo and control equipment; robots

Dynamic behavior of a piezowalker, inertial and frictional configurations

G. Mariotto, M. D’Angelo, and I. V. Shvets

Rev. Sci. Instrum. 70, 3651 (1999); http://dx.doi.org/10.1063/1.1149972 (5 pages) | Cited 21 times

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We have examined two configurations of a piezowalker, the inertial and the frictional one, both of which are capable of moving samples with submicrometer steps over a distance of some millimeters. We demonstrated that, contrary to expectations, operation of the frictional walker in which six piezos shear one by one, is still dependent on inertial slip-stick action. We studied the dependence of the step size on the time delay between rising fronts applied to consecutive piezos and we found that the characteristic time associated with the minimum value of the step size is of the order of the time of a sound wave propagating along the rod between the piezos. © 1999 American Institute of Physics.
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06.60.Sx Positioning and alignment; manipulating, remote handling
07.07.Tw Servo and control equipment; robots
85.50.-n Dielectric, ferroelectric, and piezoelectric devices
07.79.-v Scanning probe microscopes and components
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Setup for in situ x-ray diffraction and ion-channeling studies of ion-implantation effects in thin films

S. Grigull, S. Foltyn, M. G. Hollander, C. R. Evans, and M. Nastasi

Rev. Sci. Instrum. 70, 3656 (1999); http://dx.doi.org/10.1063/1.1149973 (5 pages) | Cited 2 times

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A novel setup is introduced that combines energy-dispersive x-ray diffraction and ion-channeling capabilities for damage studies on single-crystalline thin films irradiated with 100–720 keV heavy ions. Channeling measurements using 2 MeV He ions provide depth-resolved information on the damage buildup. The x-ray diffraction tool is used to measure damage-related lattice strain, and can provide information on bombardment-induced disorder complementary to the channeling technique. Data obtained during the implantation of 360 keV Ar2+ ions into a zirconia thin film illustrate the potential of the instrument. © 1999 American Institute of Physics.
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61.05.cp X-ray diffraction
61.80.Jh Ion radiation effects
61.85.+p Channeling phenomena (blocking, energy loss, etc.)
07.85.-m X- and γ-ray instruments
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