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Dec 1999

Volume 70, Issue 12, pp. 4457-4738

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Comment on “Noise averaging and measurement resolution” [Rev. Sci. Instrum. 70, 2038–2040 (1999)]

A. W. Sloman

Rev. Sci. Instrum. 70, 4734 (1999); http://dx.doi.org/10.1063/1.1150138 (1 page)

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The paper presents a superficial analysis, based on computer simulation, of a subject which has already been discussed at some length and for which analytic results have been presented. The authors appears to use “uniform dither” where several authors recommend “triangular dither” which gives 50% more quantization noise, but makes the quantization noise independent of signal level. The author also fails to mention the possibility of using “subtractive dither” which is technically difficult, but justifiable in expensive systems. © 1999 American Institute of Physics.
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42.62.Eh Metrological applications; optical frequency synthesizers for precision spectroscopy
84.40.Ua Telecommunications: signal transmission and processing; communication satellites
06.20.Dk Measurement and error theory
06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
07.68.+m Photography, photographic instruments; xerography
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Reply to “Comment on ‘Noise averaging and measurement resolution’ ” [Rev. Sci. Instrum. 70, 2038–2040 (1999)]

James Potzick

Rev. Sci. Instrum. 70, 4735 (1999); http://dx.doi.org/10.1063/1.1150144 (1 page)

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The Comment expands the scope of the original article. A subsequent expanded version of that article includes references to the work mentioned in the Comment.
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42.62.Eh Metrological applications; optical frequency synthesizers for precision spectroscopy
06.20.Dk Measurement and error theory
84.40.Ua Telecommunications: signal transmission and processing; communication satellites
02.70.Hm Spectral methods
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Comment on “Direct measurement of refractive-index dispersion using a time-delayed technique” [Rev. Sci. Instrum. 69, 1472–1475 (1998)]

H. Delbarre, C. Przygodzki, and D. Boucher

Rev. Sci. Instrum. 70, 4736 (1999); http://dx.doi.org/10.1063/1.1150139 (1 page) | Cited 1 time

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In the article on which we comment, the authors have in fact only determined the group index of the materials. © 1999 American Institute of Physics.
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07.60.Hv Refractometers and reflectometers
42.65.Re Ultrafast processes; optical pulse generation and pulse compression
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