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Rev. Sci. Instrum. 67, 19 (1996); http://dx.doi.org/10.1063/1.1146544 (10 pages)
Photothermal dielectric spectroscopic microscope
(Received 13 October 1994; accepted 24 September 1995)
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Add to FacebookA new photothermal technique is proposed. It is based on the temperature characteristic of the dielectric constant of light‐irradiated material. When chopped light is absorbed in a dielectric material, an alternating variation of capacitance is caused by the heat produced due to light absorption and is detected by using a frequency demodulation technique. A quantitative derivation is presented for the alternating capacitance variation in terms of the optical, thermal, dielectric, and geometric parameters of the system. The experimental results for lead zirconate titanate ceramics, barium titanate single‐crystal, TiO2–Bi2Ti4O11 ceramics, and ethyl alcohol are shown, where the observed signals agree with theoretical ones very well. © 1996 American Institute of Physics.
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