The practical aspects of asymmetric crystal topography are described. In this technique, asymmetric Bragg diffraction is utilized to obtain a monochromatic and well collimated x‐ray beam large enough to cover the entire area of sample crystals. Thus, the recording of diffracted beams from a sample crystal provides topographic images of the entire sample crystal. Advantages of this technique are simplicity (no scanning device), excellent sensitivity to crystal imperfections (strain fields), and versatility. Information is given on the general alignment of the camera, magnification of the x‐ray beam width, preparation of the first crystal, and divergence of the beam due to the first crystal. The practical aspects of this topographic system are demonstrated using thick Cu and Ni crystals of various degrees of perfection. An inexpensive image intensifier is also described, which is used routinely to aid in the alignment of sample crystals.