A probe is described that will determine (a) contact resistance with continuously increasing pressure from 0–1000 g, (b) contact resistance as a function of wipe distance at fixed normal load, and (c) the current‐voltage properties of films from 0–200 V. In pressure and voltage modes, specimen positioning is entirely automatic and programmable. The probe locates the test surface on an X‐Y plane, goes through the selected mode, and then automatically repositions and repeats the measurement according to test schedule. The wipe mode is performed manually. Resistance, current, voltage, load, wipe distance, and location of the specimen are read out on an oscillographic recorder. Contact resistance is measured by the four‐point technique from 10−4 to 103 Ω. The resistance span is divided into six ranges which change automatically, from high to low, when the resistance decreases to a preset percentage of the scale. The open circuit dc voltage of the resistance measuring circuit is 10−2 or 5×10−2 V, depending on resistance range.