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Review of Scientific Instruments / Volume 30 / Issue 7

Rev. Sci. Instrum. 30, 548 (1959); http://dx.doi.org/10.1063/1.1716679 (10 pages)

Versatile and Sensitive Vibrating‐Sample Magnetometer

Simon Foner

Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, Massachusetts

(Received 15 January 1959)

A vibrating‐sample magnetometer, which measures the magnetic moment of a sample when it is vibrated perpendicularly to a uniform magnetizing field, is described. With this instrument, changes as small as 10−5 to 10−6 emu have been detected, and a stability of one part in 104 has been attained. In addition to permitting convenient measurements in the usual laboratory electromagnet, this instrument eliminates or minimizes many sources of error found in other methods. It is simple, inexpensive, and versatile, yet permits precision magnetic moment measurements to be made in a uniform magnetizing field as a function of temperature, magnetizing field, and crystallographic orientation. The mechanical design and detailed operating characteristics are presented. Applications and limitations of the method are outlined.

© 1959 The American Institute of Physics

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ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.1716679

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef The American Institute of Physics

For access to fully linked references, you need to log in.
    W. P. Wolf, J. Appl. Phys. 28, 780 (1957)JAPIAU000028000007000780000001.

    S. Foner, Phys. Rev. 101, 1648 (1956).

    Such measurements of Ms to 1% have been made on thin Permalloy films which exhibit narrow resonance line widths. See M. H. Seavey, Jr. and P. E. Tannenwald, J. Appl. Phys. 29, 292 (1958)JAPIAU000029000003000292000001.

    D. O. Smith, Rev. Sci. Instr. 27, 261 (1956)RSINAK000027000005000261000001
    , and more recently Dwight, Menyuk, and Smith, J. Appl. Phys. 29, 491 (1958)JAPIAU000029000003000491000001.

    S. Foner, Rev. Sci. Instr. 27, 548 (1956)RSINAK000027000007000548000001.

    A. Arrott and J. E. Goldman, Rev. Sci. Instr. 28, 99 (1957)RSINAK000028000002000099000001 employed such a technique with a moving sample. Here again, the sample motion was parallel to the applied field direction.

    D. K. Stevens and J. H. Crawford, Jr., Phys. Rev. 92, 1065 (1953). Specifically they report chi = 10−10 cgs units/g can be measured for a 1-g Ge sample when H = 18 kilogauss and [partial-derivative]H/[partial-derivative]chi~=3 kilogauss/cm.

    See, for instance, S. Foner and J. O. Artman, J. Appl. Phys. 29, 443 (1958)JAPIAU000029000003000443000001.


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