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Top 20 Most Read Articles

September 2009

The 20 articles with the most full-text downloads during the month, in descending order.


Invited Review Article: Imaging techniques for harmonic and multiphoton absorption fluorescence microscopy

Ramón Carriles, Dawn N. Schafer, Kraig E. Sheetz, Jeffrey J. Field, Richard Cisek, Virginijus Barzda, Anne W. Sylvester, and Jeffrey A. Squier

Rev. Sci. Instrum. 80, 081101 (2009); http://dx.doi.org/10.1063/1.3184828 (23 pages)

Online Publication Date: 5 August 2009

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We review the current state of multiphoton microscopy. In particular, the requirements and limitations associated with high-speed multiphoton imaging are considered. A description of the different scanning technologies such as line scan, multifoci approaches, multidepth microscopy, and novel detection techniques is given. The main nonlinear optical contrast mechanisms employed in microscopy are reviewed, namely, multiphoton excitation fluorescence, second harmonic generation, and third harmonic generation. Techniques for optimizing these nonlinear mechanisms through a careful measurement of the spatial and temporal characteristics of the focal volume are discussed, and a brief summary of photobleaching effects is provided. Finally, we consider three new applications of multiphoton microscopy: nonlinear imaging in microfluidics as applied to chemical analysis and the use of two-photon absorption and self-phase modulation as contrast mechanisms applied to imaging problems in the medical sciences.
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42.65.Ky Frequency conversion; harmonic generation, including higher-order harmonic generation
42.62.Fi Laser spectroscopy
42.65.Jx Beam trapping, self-focusing and defocusing; self-phase modulation

WSXM: A software for scanning probe microscopy and a tool for nanotechnology

I. Horcas, R. Fernández, J. M. Gómez-Rodríguez, J. Colchero, J. Gómez-Herrero, and A. M. Baro

Rev. Sci. Instrum. 78, 013705 (2007); http://dx.doi.org/10.1063/1.2432410 (8 pages)

Online Publication Date: 31 January 2007

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In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
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07.79.Cz Scanning tunneling microscopes

A compact apparatus for studies of element and phase-resolved ferromagnetic resonance

D. A. Arena, Y. Ding, E. Vescovo, S. Zohar, Y. Guan, and W. E. Bailey

Rev. Sci. Instrum. 80, 083903 (2009); http://dx.doi.org/10.1063/1.3190402 (7 pages)

Online Publication Date: 11 August 2009

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We present a compact sample holder equipped with electromagnets and high frequency transmission lines; the sample holder is intended for combined x-ray magnetic circular dichroism (XMCD) and ferromagnetic resonance measurements (FMR). Time-resolved measurements of resonant x-ray detected FMR during forced precession are enabled by use of a rf excitation that is phase-locked to the storage ring bunch clock. Several applications of the combined XMCD+FMR technique are presented, demonstrating the flexibility of the experimental design.
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07.55.-w Magnetic instruments and components
76.50.+g Ferromagnetic, antiferromagnetic, and ferrimagnetic resonances; spin-wave resonance
78.20.Ls Magneto-optical effects
07.85.-m X- and γ-ray instruments

A compact molecular beam machine

Paul Jansen, David W. Chandler, and Kevin E. Strecker

Rev. Sci. Instrum. 80, 083105 (2009); http://dx.doi.org/10.1063/1.3206367 (5 pages)

Online Publication Date: 31 August 2009

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We have developed a compact, low cost, modular, crossed molecular beam machine. The new apparatus utilizes several technological advancements in molecular beams valves, ion detection, and vacuum pumping to reduce the size, cost, and complexity of a molecular beam apparatus. We apply these simplifications to construct a linear molecular beam machine as well as a crossed-atomic and molecular beam machine. The new apparatus measures almost 50 cm in length, with a total laboratory footprint less than 0.25 m2 for the crossed-atomic and molecular beam machine. We demonstrate the performance of the apparatus by measuring the rotational temperature of nitric oxide from three common molecular beam valves and by observing collisional energy transfer in nitric oxide from a collision with argon.
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07.75.+h Mass spectrometers
07.30.Cy Vacuum pumps

Design of a variable temperature scanning force microscope

E. Nazaretski, K. S. Graham, J. D. Thompson, J. A. Wright, D. V. Pelekhov, P. C. Hammel, and R. Movshovich

Rev. Sci. Instrum. 80, 083704 (2009); http://dx.doi.org/10.1063/1.3212561 (6 pages)

Online Publication Date: 31 August 2009

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We have developed the variable temperature scanning force microscope capable of performing both magnetic resonance force microscopy (MRFM) and magnetic force microscopy (MFM) measurements in the temperature range between 5 and 300 K. Modular design, large scanning area, and interferometric detection of the cantilever deflection make it a sensitive, easy to operate, and reliable instrument suitable for studies of the dynamic and static magnetization in various systems. We have verified the performance of the microscope by imaging vortices in a Nb thin film in the MFM mode of operation. MRFM spectra in a diphenyl-picryl-hydrazyl film were recorded to evaluate the MRFM mode of operation.
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07.79.Lh Atomic force microscopes
07.79.Pk Magnetic force microscopes
75.70.Ak Magnetic properties of monolayers and thin films
75.60.Ej Magnetization curves, hysteresis, Barkhausen and related effects

Simultaneous readout of multiple microcantilever arrays with phase-shifting interferometric microscopy

Sven Kelling, François Paoloni, Juzheng Huang, Victor P. Ostanin, and Stephen R. Elliott

Rev. Sci. Instrum. 80, 093101 (2009); http://dx.doi.org/10.1063/1.3212667 (8 pages)

Online Publication Date: 2 September 2009

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A complete system for the simultaneous monitoring of multiple cantilever sensors from different sensor arrays has been developed and tested for gas- and liquid-phase applications. The cantilever sensors are operated in static-deflection mode and the readout is achieved with phase-shifting interferometric microscopy (PSIM). In contrast to existing cantilever-sensor readout methods, PSIM is not dependent on alignment and allows the monitoring of the entire displacement profiles of all cantilevers within the field of view, using just one light source. To complement the PSIM readout, we have developed a sample cell, which can hold multiple cantilever-array chips, allows for very fast and reproducible sensor-chip replacement, has very low sample-volume requirements, and allows for individual or common addressing of all chips in the sample cell. We demonstrate the functionality of our microcantilever sensor system with a setup that can monitor eight cantilevers from four different sensor chips simultaneously.
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07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
07.60.Ly Interferometers
07.10.Cm Micromechanical devices and systems

How to measure forces with atomic force microscopy without significant influence from nonlinear optical lever sensitivity

Esben Thormann, Torbjön Pettersson, and Per M. Claesson

Rev. Sci. Instrum. 80, 093701 (2009); http://dx.doi.org/10.1063/1.3194048 (11 pages)

Online Publication Date: 3 September 2009

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In an atomic force microscope (AFM), the force is normally sensed by measuring the deflection of a cantilever by an optical lever technique. Experimental results show a nonlinear relationship between the detected signal and the actual deflection of the cantilever, which is widely ignored in literature. In this study we have designed experiments to investigate different possible reasons for this nonlinearity and compared the experimental findings with calculations. It is commonly assumed that this nonlinearity only causes problems for extremely large cantilever deflections. However, our results show that the nonlinear detector response might influence many AFM studies where soft or short cantilevers are used. Based on our analysis we draw conclusions of the main reason for the nonlinearity and suggest a rule of thumb for which cantilevers one should use under different experimental conditions.
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07.79.Lh Atomic force microscopes

Thermal conductivity measurement from 30 to 750 K: the 3ω method

David G. Cahill

Rev. Sci. Instrum. 61, 802 (1990); http://dx.doi.org/10.1063/1.1141498 (7 pages)

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An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black‐body radiation are calculated to be less than 2% even at 1000 K. Data for a‐SiO2, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques.
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07.20.-n Thermal instruments and apparatus
66.70.-f Nonelectronic thermal conduction and heat-pulse propagation in solids; thermal waves

Optical trapping

Keir C. Neuman and Steven M. Block

Rev. Sci. Instrum. 75, 2787 (2004); http://dx.doi.org/10.1063/1.1785844 (23 pages)

Online Publication Date: 2 September 2004

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Since their invention just over 20 years ago, optical traps have emerged as a powerful tool with broad-reaching applications in biology and physics. Capabilities have evolved from simple manipulation to the application of calibrated forces on—and the measurement of nanometer-level displacements of—optically trapped objects. We review progress in the development of optical trapping apparatus, including instrument design considerations, position detection schemes and calibration techniques, with an emphasis on recent advances. We conclude with a brief summary of innovative optical trapping configurations and applications.
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37.10.Vz Mechanical effects of light on atoms, molecules, and ions
06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
01.30.Rr Surveys and tutorial papers; resource letters
06.20.F- Units and standards
87.80.Cc Optical trapping

Nanoelectromechanical systems

K. L. Ekinci and M. L. Roukes

Rev. Sci. Instrum. 76, 061101 (2005); http://dx.doi.org/10.1063/1.1927327 (12 pages)

Online Publication Date: 26 May 2005

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Nanoelectromechanical systems (NEMS) are drawing interest from both technical and scientific communities. These are electromechanical systems, much like microelectromechanical systems, mostly operated in their resonant modes with dimensions in the deep submicron. In this size regime, they come with extremely high fundamental resonance frequencies, diminished active masses,and tolerable force constants; the quality (Q) factors of resonance are in the range Q ∼ 103–105—significantly higher than those of electrical resonant circuits. These attributes collectively make NEMS suitable for a multitude of technological applications such as ultrafast sensors, actuators, and signal processing components. Experimentally, NEMS are expected to open up investigations of phonon mediated mechanical processes and of the quantum behavior of mesoscopic mechanical systems. However, there still exist fundamental and technological challenges to NEMS optimization. In this review we shall provide a balanced introduction to NEMS by discussing the prospects and challenges in this rapidly developing field and outline an exciting emerging application, nanoelectromechanical mass detection.
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85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
85.35.-p Nanoelectronic devices

Retraction: “High-resolution reflecting time-of-flight momentum and energy mapping system” [ Rev. Sci. Instrum. 80, 075101 (2009) ]

Chao Wang (王超), Yifan Kang (康轶凡), Larry Weaver, and Zenghu Chang

Rev. Sci. Instrum. 80, 097101 (2009); http://dx.doi.org/10.1063/1.3212562 (1 page)

Online Publication Date: 4 September 2009

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99.10.Ln Retraction

Femtosecond pulse shaping using spatial light modulators

A. M. Weiner

Rev. Sci. Instrum. 71, 1929 (2000); http://dx.doi.org/10.1063/1.1150614 (32 pages)

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We review the field of femtosecond pulse shaping, in which Fourier synthesis methods are used to generate nearly arbitrarily shaped ultrafast optical wave forms according to user specification. An emphasis is placed on programmable pulse shaping methods based on the use of spatial light modulators. After outlining the fundamental principles of pulse shaping, we then present a detailed discussion of pulse shaping using several different types of spatial light modulators. Finally, new research directions in pulse shaping, and applications of pulse shaping to optical communications, biomedical optical imaging, high power laser amplifiers, quantum control, and laser-electron beam interactions are reviewed. © 2000 American Institute of Physics.
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42.65.Re Ultrafast processes; optical pulse generation and pulse compression
42.79.Hp Optical processors, correlators, and modulators
01.30.Rr Surveys and tutorial papers; resource letters
42.60.Fc Modulation, tuning, and mode locking

Wideband digital frequency detector with subtraction-based phase comparator for frequency modulation atomic force microscopy

Yuji Mitani, Mamoru Kubo, Ken-ichiro Muramoto, and Takeshi Fukuma

Rev. Sci. Instrum. 80, 083705 (2009); http://dx.doi.org/10.1063/1.3212670 (3 pages)

Online Publication Date: 31 August 2009

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We have developed a wideband digital frequency detector for high-speed frequency modulation atomic force microscopy (FM-AFM). We used a subtraction-based phase comparator (PC) in a phase-locked loop circuit instead of a commonly used multiplication-based PC, which has enhanced the detection bandwidth to 100 kHz. The quantitative analysis of the noise performance revealed that the internal noise from the developed detector is small enough to provide the theoretically limited noise performance in FM-AFM experiments in liquid. FM-AFM imaging of mica in liquid was performed with the developed detector, showing its stability and applicability to true atomic-resolution imaging in liquid.
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07.79.Lh Atomic force microscopes
84.30.Qi Modulators and demodulators; discriminators, comparators, mixers, limiters, and compressors

An open source/real-time atomic force microscope architecture to perform customizable force spectroscopy experiments

Donatello Materassi, Paolo Baschieri, Bruno Tiribilli, Giampaolo Zuccheri, and Bruno Samorì

Rev. Sci. Instrum. 80, 084301 (2009); http://dx.doi.org/10.1063/1.3194046 (6 pages)

Online Publication Date: 10 August 2009

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We describe the realization of an atomic force microscope architecture designed to perform customizable experiments in a flexible and automatic way. Novel technological contributions are given by the software implementation platform (RTAI-LINUX), which is free and open source, and from a functional point of view, by the implementation of hard real-time control algorithms. Some other technical solutions such as a new way to estimate the optical lever constant are described as well. The adoption of this architecture provides many degrees of freedom in the device behavior and, furthermore, allows one to obtain a flexible experimental instrument at a relatively low cost. In particular, we show how such a system has been employed to obtain measures in sophisticated single-molecule force spectroscopy experiments [ Fernandez and Li, Science 303, 1674 (2004) ]. Experimental results on proteins already studied using the same methodologies are provided in order to show the reliability of the measure system.
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07.79.Lh Atomic force microscopes
87.64.Dz Scanning tunneling and atomic force microscopy
87.14.E- Proteins

Calibration of atomic‐force microscope tips

Jeffrey L. Hutter and John Bechhoefer

Rev. Sci. Instrum. 64, 1868 (1993); http://dx.doi.org/10.1063/1.1143970 (6 pages)

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Images and force measurements taken by an atomic‐force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional equipment.
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68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
87.64.Dz Scanning tunneling and atomic force microscopy

Holders for in situ treatments of scanning tunneling microscopy tips

Nobuyuki Ishida, Agus Subagyo, Akira Ikeuchi, and Kazuhisa Sueoka

Rev. Sci. Instrum. 80, 093703 (2009); http://dx.doi.org/10.1063/1.3223974 (4 pages)

Online Publication Date: 15 September 2009

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We have developed holders for scanning tunneling microscopy tips that can be used for in situ treatments of the tips, such as electron bombardment (EB) heating, ion sputtering, and the coating of magnetic materials. The holders can be readily installed into the transfer paths and do not require any special type of base stages. Scanning electron microscopy is used to characterize the tip apex after EB heating. Also, spin-polarized scanning tunneling spectroscopy using an Fe coated W tip on the Cr(001) single crystal surface is performed in order to confirm both the capability of heating a tip up to about 2200 K and the spin sensitivity of the magnetically coated tip.
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07.79.Cz Scanning tunneling microscopes
07.78.+s Electron, positron, and ion microscopes; electron diffractometers
81.40.Gh Other heat and thermomechanical treatments

Combined holographic-mechanical optical tweezers: Construction, optimization, and calibration

Richard D. L. Hanes, Matthew C. Jenkins, and Stefan U. Egelhaaf

Rev. Sci. Instrum. 80, 083703 (2009); http://dx.doi.org/10.1063/1.3196181 (7 pages)

Online Publication Date: 26 August 2009

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A spatial light modulator (SLM) and a pair of galvanometer-mounted mirrors (GMM) were combined into an optical tweezers setup. This provides great flexibility as the SLM creates an array of traps, which can be moved smoothly and quickly with the GMM. To optimize performance, the effect of the incidence angle on the SLM with respect to phase and intensity response was investigated. Although it is common to use the SLM at an incidence angle of 45°, smaller angles give a full 2π phase shift and an output intensity which is less dependent on the magnitude of the phase shift. The traps were calibrated using an active oscillatory technique and a passive probability distribution method.
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42.40.Eq Holographic optical elements; holographic gratings
42.50.Wk Mechanical effects of light on material media, microstructures and particles
42.79.Hp Optical processors, correlators, and modulators
06.20.F- Units and standards
02.50.Ng Distribution theory and Monte Carlo studies
42.79.Bh Lenses, prisms and mirrors

Time‐of‐Flight Mass Spectrometer with Improved Resolution

W. C. Wiley and I. H. McLaren

Rev. Sci. Instrum. 26, 1150 (1955); http://dx.doi.org/10.1063/1.1715212 (8 pages)

Online Publication Date: 29 December 2004

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A new type of ion gun is described which greatly improves the resolution of a nonmagnetic time‐of‐flight mass spectrometer. The focusing action of this gun is discussed and analyzed mathematically. The validity of the analysis and the practicability of the gun are demonstrated by the spectra obtained. The spectrometer is capable of measuring the relative abundance of adjacent masses well beyond 100 amu.

Thermoelectric properties and efficiency measurements under large temperature differences

A. Muto, D. Kraemer, Q. Hao, Z. F. Ren, and G. Chen

Rev. Sci. Instrum. 80, 093901 (2009); http://dx.doi.org/10.1063/1.3212668 (7 pages)

Online Publication Date: 1 September 2009

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The maximum efficiency of a thermoelectric generator is determined by the material’s dimensionless figure of merit ZT. Real thermoelectric material properties are highly temperature dependent and are often measured individually using multiple measurement tools on different samples. As a result, reported ZT values have large uncertainties. In this work we present an experimental technique that eliminates some of these uncertainties. We measure the Seebeck coefficient, electrical conductivity, and thermal conductivity of a single element or leg, as well as the conversion efficiency, under a large temperature difference of 2–160 °C. The advantages of this technique include (1) the thermoelectric leg is mounted only once and all measurements are in the same direction and (2) the measured properties are corroborated by efficiency measurements. The directly measured power and efficiency are compared to the values calculated from the measured properties and agree within 0.4% and 2%, respectively. The realistic testing conditions of this technique make it ideal for material characterization prior to implementation in a real thermoelectric generator.
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84.60.Rb Thermoelectric, electrogasdynamic and other direct energy conversion
07.20.-n Thermal instruments and apparatus
84.37.+q Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)

A simple ac bridge for detecting small resistance change

Xiaohui Song, Yirong Jin, Xin Zhang, Yude Yu, and Dian-lin Zhang

Rev. Sci. Instrum. 80, 086104 (2009); http://dx.doi.org/10.1063/1.3202284 (2 pages)

Online Publication Date: 18 August 2009

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A simple ac resistance bridge is proposed. The stability of the design is better than 10−6, which is especially suitable for detecting tiny changes of resistance. An example of magnetoresistance measurement for a 220 nm Au film shows the good performance of the bridge.
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07.68.+m Photography, photographic instruments; xerography
73.40.Cg Contact resistance, contact potential
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