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Top 20 Most Read Articles

September 2008

The 20 articles with the most full-text downloads during the month, in descending order.


Invited Review Article: Accurate and fast nanopositioning with piezoelectric tube scanners: Emerging trends and future challenges

S. O. Reza Moheimani

Rev. Sci. Instrum. 79, 071101 (2008); http://dx.doi.org/10.1063/1.2957649 (11 pages)

Online Publication Date: 21 July 2008

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Piezoelectric tube scanners have emerged as the most widely used nanopositioning technology in modern scanning probe microscopes. Despite their impressive properties, their fast and accurate operations are hindered due to complications such as scan induced mechanical vibrations, hysteresis nonlinearity, creep, and thermal drift. This paper presents an overview of emerging innovative solutions inspired from recent advances in fields such as smart structures, feedback control, and advanced estimation aimed at maximizing positioning precision and bandwidth of piezoelectric tube scanners. The paper presents a thorough survey of the related literature and contains suggestions for future research prospects.
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07.79.-v Scanning probe microscopes and components
85.50.-n Dielectric, ferroelectric, and piezoelectric devices
81.16.Ta Atom manipulation
37.10.-x Atom, molecule, and ion cooling methods
06.60.Sx Positioning and alignment; manipulating, remote handling
01.30.Rr Surveys and tutorial papers; resource letters

WSXM: A software for scanning probe microscopy and a tool for nanotechnology

I. Horcas, R. Fernández, J. M. Gómez-Rodríguez, J. Colchero, J. Gómez-Herrero, and A. M. Baro

Rev. Sci. Instrum. 78, 013705 (2007); http://dx.doi.org/10.1063/1.2432410 (8 pages)

Online Publication Date: 31 January 2007

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In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
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07.79.Cz Scanning tunneling microscopes

Ultrasensitive low noise voltage amplifier for spectral analysis

G. Giusi, F. Crupi, and C. Pace

Rev. Sci. Instrum. 79, 084701 (2008); http://dx.doi.org/10.1063/1.2967339 (6 pages)

Online Publication Date: 7 August 2008

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Recently we have proposed several voltage noise measurement methods that allow, at least in principle, the complete elimination of the noise introduced by the measurement amplifier. The most severe drawback of these methods is that they require a multistep measurement procedure. Since environmental conditions may change in the different measurement steps, the final result could be affected by these changes. This problem is solved by the one-step voltage noise measurement methodology based on a novel amplifier topology proposed in this paper. Circuit implementations for the amplifier building blocks based on operational amplifiers are critically discussed. The proposed approach is validated through measurements performed on a prototype circuit.
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84.37.+q Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)

Femtosecond pulse shaping using spatial light modulators

A. M. Weiner

Rev. Sci. Instrum. 71, 1929 (2000); http://dx.doi.org/10.1063/1.1150614 (32 pages)

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We review the field of femtosecond pulse shaping, in which Fourier synthesis methods are used to generate nearly arbitrarily shaped ultrafast optical wave forms according to user specification. An emphasis is placed on programmable pulse shaping methods based on the use of spatial light modulators. After outlining the fundamental principles of pulse shaping, we then present a detailed discussion of pulse shaping using several different types of spatial light modulators. Finally, new research directions in pulse shaping, and applications of pulse shaping to optical communications, biomedical optical imaging, high power laser amplifiers, quantum control, and laser-electron beam interactions are reviewed. © 2000 American Institute of Physics.
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42.65.Re Ultrafast processes; optical pulse generation and pulse compression
42.79.Hp Optical processors, correlators, and modulators
01.30.Rr Surveys and tutorial papers; resource letters
42.60.Fc Modulation, tuning, and mode locking

A novel pressure-driven piezodispenser for nanoliter volumes

Shawn McGuire, Charles Fisher, Mark Holl, and Deirdre Meldrum

Rev. Sci. Instrum. 79, 086111 (2008); http://dx.doi.org/10.1063/1.2969658 (3 pages)

Online Publication Date: 21 August 2008

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A successful dispensing device has been built for use in biotechnology applications requiring nanoliter volume liquid transfer. Air pressure is used as the primary driving force and is controlled via a high speed miniature solenoid valve as opposed to many existing systems that use a valve in line with constantly pressurized fluid to start and stop the dispensing action. This automated pressure-driven system is used to improve a typical piezodriven microdispenser. The resulting system is much less prone to failures resulting from air entrainment and can dispense much higher viscosity fluids than the microdispenser alone.
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87.85.Ox Biomedical instrumentation and transducers, including micro-electro-mechanical systems (MEMS)
85.50.-n Dielectric, ferroelectric, and piezoelectric devices
85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices

High throughput system for magnetic manipulation of cells, polymers, and biomaterials

Richard Chasen Spero, Leandra Vicci, Jeremy Cribb, David Bober, Vinay Swaminathan, E. Timothy O’Brien, Stephen L. Rogers, and R. Superfine

Rev. Sci. Instrum. 79, 083707 (2008); http://dx.doi.org/10.1063/1.2976156 (7 pages)

Online Publication Date: 29 August 2008

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In the past decade, high throughput screening (HTS) has changed the way biochemical assays are performed, but manipulation and mechanical measurement of micro- and nanoscale systems have not benefited from this trend. Techniques using microbeads (particles ∼ 0.1–10 μm) show promise for enabling high throughput mechanical measurements of microscopic systems. We demonstrate instrumentation to magnetically drive microbeads in a biocompatible, multiwell magnetic force system. It is based on commercial HTS standards and is scalable to 96 wells. Cells can be cultured in this magnetic high throughput system (MHTS). The MHTS can apply independently controlled forces to 16 specimen wells. Force calibrations demonstrate forces in excess of 1 nN, predicted force saturation as a function of pole material, and powerlaw dependence of Fr−2.7±0.1. We employ this system to measure the stiffness of SR2+ Drosophila cells. MHTS technology is a key step toward a high throughput screening system for micro- and nanoscale biophysical experiments.
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87.17.Rt Cell adhesion and cell mechanics
87.16.dm Mechanical properties and rheology

Optical lever calibration in atomic force microscope with a mechanical lever

Hui Xie, Julien Vitard, Sinan Haliyo, and Stéphane Régnier

Rev. Sci. Instrum. 79, 096101 (2008); http://dx.doi.org/10.1063/1.2976108 (3 pages)

Online Publication Date: 4 September 2008

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A novel method that uses a small mechanical lever has been developed to directly calibrate the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The mechanical lever can convert the translation into a nanoscale rotation angle with a flexible hinge that provides an accurate conversion between the photodiode voltage output and torsional angle of a cantilever. During the calibration, the cantilever is mounted on a holder attached on the lever, which brings the torsional axis of the cantilever and rotation axis of the lever into line. By making use of its nanomotion on the Z-axis and using an external motion on the barrier, this device can complete the local and full-range lateral sensitivity calibrations of the optical lever without modifying the actual AFM or the cantilevers.
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07.79.Lh Atomic force microscopes

A tabletop femtosecond time-resolved soft x-ray transient absorption spectrometer

Zhi-Heng Loh, Munira Khalil, Raoul E. Correa, and Stephen R. Leone

Rev. Sci. Instrum. 79, 073101 (2008); http://dx.doi.org/10.1063/1.2947737 (13 pages)

Online Publication Date: 1 July 2008

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A laser-based, tabletop instrument is constructed to perform femtosecond soft x-ray transient absorption spectroscopy. Ultrashort soft x-ray pulses produced via high-order harmonic generation of the amplified output of a femtosecond Ti:sapphire laser system are used to probe atomic core-level transient absorptions in atoms and molecules. The results provide chemically specific, time-resolved dynamics with sub-50-fs time resolution. In this setup, high-order harmonics generated in a Ne-filled capillary waveguide are refocused by a gold-coated toroidal mirror into the sample gas cell, where the soft x-ray light intersects with an optical pump pulse. The transmitted high-order harmonics are spectrally dispersed with a homebuilt soft x-ray spectrometer, which consists of a gold-coated toroidal mirror, a uniform-line spaced plane grating, and a soft x-ray charge coupled device camera. The optical layout of the instrument, design of the soft x-ray spectrometer, and spatial and temporal characterizations of the high-order harmonics are described. Examples of static and time-resolved photoabsorption spectra collected on this apparatus are presented.
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07.85.Nc X-ray and γ-ray spectrometers
42.55.Vc X- and γ-ray lasers
42.65.Re Ultrafast processes; optical pulse generation and pulse compression
42.65.Ky Frequency conversion; harmonic generation, including higher-order harmonic generation
07.60.Rd Visible and ultraviolet spectrometers
42.79.Bh Lenses, prisms and mirrors

Performance of a Ge-microstrip imaging detector and polarimeter

U. Spillmann, H. Bräuning, S. Hess, H. Beyer, Th. Stöhlker, J.-Cl. Dousse, D. Protic, and T. Krings

Rev. Sci. Instrum. 79, 083101 (2008); http://dx.doi.org/10.1063/1.2963046 (8 pages)

Online Publication Date: 1 August 2008

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Using 98% linearly polarized radiation at the European Synchrotron Radiation Facility in Grenoble, the performance of a prototype two-dimensional microstrip Ge(i) detector for x-ray imaging and as a Compton polarimeter has been evaluated. Using the energy and position sensitivity of the detector, the ability to obtain a complete reconstruction of the Compton event has been demonstrated. The modulation coefficient of the polarimeter is in good agreement with the theoretical limit of a perfect detector.
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29.40.Wk Solid-state detectors
07.85.Fv X- and γ-ray sources, mirrors, gratings, and detectors
29.40.Gx Tracking and position-sensitive detectors

A simple cell for the analysis of nanoelectromechanical systems under gas pressure

Oleksiy Svitelskiy, Ning Liu, Vince Sauer, Kar-Mun Cheng, Eric Finley, Miro Belov, Mark R. Freeman, and Wayne K. Hiebert

Rev. Sci. Instrum. 79, 093701 (2008); http://dx.doi.org/10.1063/1.2976675 (5 pages)

Online Publication Date: 11 September 2008

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A simple yet versatile apparatus for optical microscopy investigations of solid-state devices under high gas pressures is presented. Interchangeable high-grade sapphire windows with different thicknesses allow variable choice of trade-off between the maximum operating pressure and maximum spatial resolution. The capabilities of this compact chamber were tested by performing stroboscopic optical interferometry on nanoelectromechanical systems (NEMSs) under capacitive excitation. With a 1.7 mm thick sapphire window, the cell is safe to operate at pressures ranging from vacuum to 5 MPa. Minimal optical wavefront distortion allows NEMSs with linear dimensions of 0.1×1.6 μm2 to be explored. For a sapphire window with a maximum thickness of 6 mm, the safe operating pressure increases up to an estimated 60 MPa; however, the increasing distortions inhibit signal from NEMSs smaller than ∼ 0.5×1 μm2. The cell can be used for confocal microscopy, microphotoluminescence and electroluminescence, light scattering spectroscopy, and reflectivity. The light weight and compact design of the chamber allow mounting on a precision piezomotion control stage or inside a volume tight apparatus such as cryostats.
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85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
42.79.Ci Filters, zone plates, and polarizers
07.60.Pb Conventional optical microscopes
07.60.Ly Interferometers

Thermal conductivity measurement from 30 to 750 K: the 3ω method

David G. Cahill

Rev. Sci. Instrum. 61, 802 (1990); http://dx.doi.org/10.1063/1.1141498 (7 pages)

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An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black‐body radiation are calculated to be less than 2% even at 1000 K. Data for a‐SiO2, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques.
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07.20.-n Thermal instruments and apparatus
66.70.-f Nonelectronic thermal conduction and heat-pulse propagation in solids; thermal waves

Time‐of‐Flight Mass Spectrometer with Improved Resolution

W. C. Wiley and I. H. McLaren

Rev. Sci. Instrum. 26, 1150 (1955); http://dx.doi.org/10.1063/1.1715212 (8 pages)

Online Publication Date: 29 December 2004

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A new type of ion gun is described which greatly improves the resolution of a nonmagnetic time‐of‐flight mass spectrometer. The focusing action of this gun is discussed and analyzed mathematically. The validity of the analysis and the practicability of the gun are demonstrated by the spectra obtained. The spectrometer is capable of measuring the relative abundance of adjacent masses well beyond 100 amu.

Nanoelectromechanical systems

K. L. Ekinci and M. L. Roukes

Rev. Sci. Instrum. 76, 061101 (2005); http://dx.doi.org/10.1063/1.1927327 (12 pages)

Online Publication Date: 26 May 2005

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Nanoelectromechanical systems (NEMS) are drawing interest from both technical and scientific communities. These are electromechanical systems, much like microelectromechanical systems, mostly operated in their resonant modes with dimensions in the deep submicron. In this size regime, they come with extremely high fundamental resonance frequencies, diminished active masses,and tolerable force constants; the quality (Q) factors of resonance are in the range Q ∼ 103–105—significantly higher than those of electrical resonant circuits. These attributes collectively make NEMS suitable for a multitude of technological applications such as ultrafast sensors, actuators, and signal processing components. Experimentally, NEMS are expected to open up investigations of phonon mediated mechanical processes and of the quantum behavior of mesoscopic mechanical systems. However, there still exist fundamental and technological challenges to NEMS optimization. In this review we shall provide a balanced introduction to NEMS by discussing the prospects and challenges in this rapidly developing field and outline an exciting emerging application, nanoelectromechanical mass detection.
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85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
85.35.-p Nanoelectronic devices

Absolute calibration of an electron spectrometer using high energy electrons produced by the laser-plasma interaction

S. Masuda, E. Miura, K. Koyama, and S. Kato

Rev. Sci. Instrum. 79, 083301 (2008); http://dx.doi.org/10.1063/1.2969655 (4 pages)

Online Publication Date: 19 August 2008

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An in situ observation system has been developed to observe the absolute electron energy spectra of electron beams generated by laser-plasma interaction. A phosphor screen (DRZ) coupled with a charge coupled device camera is used to detect the electrons. A new method is proposed to calibrate the absolute sensitivity of the detection system for a wide energy range with a single shot by using an electron beam generated by laser-plasma interaction. The sensitivity of the system is found to be high, which is comparable to that of an imaging plate.
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07.81.+a Electron and ion spectrometers
41.75.Fr Electron and positron beams
06.20.F- Units and standards
42.79.Pw Imaging detectors and sensors

Focusing mirror for x-ray free-electron lasers

Hidekazu Mimura, Shinya Morita, Takashi Kimura, Daisuke Yamakawa, Weimin Lin, Yoshihiro Uehara, Satoshi Matsuyama, Hirokatsu Yumoto, Haruhiko Ohashi, Kenji Tamasaku, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa, Hitoshi Ohmori, and Kazuto Yamauchi

Rev. Sci. Instrum. 79, 083104 (2008); http://dx.doi.org/10.1063/1.2964928 (4 pages)

Online Publication Date: 6 August 2008

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We present the design, fabrication, and evaluation of a large total-reflection mirror for focusing x-ray free-electron laser beams to nanometer dimensions. We used an elliptical focusing mirror made of silicon that was 400 mm long and had a focal length of 550 mm. Electrolytic in-process dressing grinding was used for initial-step figuring and elastic emission machining was employed for final figuring and surface smoothing. A figure accuracy with a peak-to-valley height of 2 nm was achieved across the entire area. Characterization of the focused beam was performed at BL29XUL of SPring-8. The focused beam size was 75 nm at 15 keV, which is almost equal to the theoretical size.
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42.79.Bh Lenses, prisms and mirrors
42.60.By Design of specific laser systems
41.60.Cr Free-electron lasers

Standing wave probes for microassembly

Shane Woody, Bartosz Nowakowski, Marcin Bauza, and Stuart Smith

Rev. Sci. Instrum. 79, 085107 (2008); http://dx.doi.org/10.1063/1.2957623 (9 pages)

Online Publication Date: 25 August 2008

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A single standing wave sensor was investigated and experiments demonstrated release capability of glass microscale objects. It is shown that this micrometer scale fiber may be employed as miniaturized tweezers able to pick up specimens and routinely release them when the standing wave is energized. Furthermore, it is demonstrated that the standing wave probe has sensing capability. Both phase and magnitude indicate when the specimen releases, and also provide postrelease information such as mass of sphere and its rotation about its own axis or, surprisingly, about the probe fiber. The current experiments investigated only the release forces acting normal to the sphere/fiber contact interface. Some work was performed by changing the virtual tip from a normally applied force to a tangential applied force. In this condition, the specimen was observed to release differently.
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85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
07.10.Cm Micromechanical devices and systems
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

Calibration of rectangular atomic force microscope cantilevers

John E. Sader, James W. M. Chon, and Paul Mulvaney

Rev. Sci. Instrum. 70, 3967 (1999); http://dx.doi.org/10.1063/1.1150021 (3 pages)

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A method to determine the spring constant of a rectangular atomic force microscope cantilever is proposed that relies solely on the measurement of the resonant frequency and quality factor of the cantilever in fluid (typically air), and knowledge of its plan view dimensions. This method gives very good accuracy and improves upon the previous formulation by Sader et al. [Rev. Sci. Instrum. 66, 3789 (1995)] which, unlike the present method, requires knowledge of both the cantilever density and thickness. © 1999 American Institute of Physics.
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07.79.Lh Atomic force microscopes
06.20.F- Units and standards
07.10.Cm Micromechanical devices and systems

Improvement of a dynamic scanning force microscope for highest resolution imaging in ultrahigh vacuum

S. Torbrügge, J. Lübbe, L. Tröger, M. Cranney, T. Eguchi, Y. Hasegawa, and M. Reichling

Rev. Sci. Instrum. 79, 083701 (2008); http://dx.doi.org/10.1063/1.2964119 (7 pages)

Online Publication Date: 4 August 2008

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We report on a modification of a commercial scanning force microscope (Omicron UHV AFM/STM) operated in noncontact mode (NC-AFM) at room temperature in ultrahigh vacuum yielding a decrease in the spectral noise density from 2757 to 272 fm/math. The major part of the noise reduction is achieved by an exchange of the originally installed light emitting diode by a laser diode placed outside the vacuum, where the light is coupled into the ultrahigh vacuum chamber via an optical fiber. The setup is further improved by the use of preamplifiers having a bandpass characteristics tailored to the cantilever resonance frequency. The enhanced signal to noise ratio is demonstrated by a comparison of atomic resolution images on CeO2(111) obtained before and after the modification.
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07.79.Lh Atomic force microscopes
42.55.Px Semiconductor lasers; laser diodes
42.81.Qb Fiber waveguides, couplers, and arrays

Local potentiometry using a multiprobe scanning tunneling microscope

A. Bannani, C. A. Bobisch, and R. Möller

Rev. Sci. Instrum. 79, 083704 (2008); http://dx.doi.org/10.1063/1.2968111 (6 pages)

Online Publication Date: 20 August 2008

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Scanning tunneling potentiometry (STP) is a powerful tool to analyze the conductance through thin conducting layers with lateral resolution in the nanometer range. In this work, we show how a commercial ultrahigh vacuum multiprobe system, equipped with four independent tips, can be used to perform STP experiments. Two tips are gently pushed into the surface applying a lateral current through the layer of interest. Simultaneously, the topography and the potential distribution across the metal film are measured with a third tip. The signal-to-noise ratio of the potentiometry signal may be enhanced by using a fourth tip, providing a reference potential in close vicinity of the studied area. Two different examples are presented. For epitaxial (111) oriented Bi films, grown on a Si(100)-(2×1) surface, an almost constant gradient of the potential as well as potential drops at individual Bi-domain boundaries were observed. On the surface of the Si(111)(math×math)–Ag superstructure the potential variation at individual monoatomic steps could be precisely resolved.
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07.79.Cz Scanning tunneling microscopes
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
73.61.At Metal and metallic alloys
73.61.Cw Elemental semiconductors
73.25.+i Surface conductivity and carrier phenomena
68.55.-a Thin film structure and morphology

Cantilever transducers as a platform for chemical and biological sensors

Nickolay V. Lavrik, Michael J. Sepaniak, and Panos G. Datskos

Rev. Sci. Instrum. 75, 2229 (2004); http://dx.doi.org/10.1063/1.1763252 (25 pages)

Online Publication Date: 21 June 2004

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Since the late 1980s there have been spectacular developments in micromechanical or microelectro-mechanical (MEMS) systems which have enabled the exploration of transduction modes that involve mechanical energy and are based primarily on mechanical phenomena. As a result an innovative family of chemical and biological sensors has emerged. In this article, we discuss sensors with transducers in a form of cantilevers. While MEMS represents a diverse family of designs, devices with simple cantilever configurations are especially attractive as transducers for chemical and biological sensors. The review deals with four important aspects of cantilever transducers: (i) operation principles and models; (ii) microfabrication; (iii) figures of merit; and (iv) applications of cantilever sensors. We also provide a brief analysis of historical predecessors of the modern cantilever sensors. © 2004 American Institute of Physics.
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07.07.Mp Transducers
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
87.80.-y Biophysical techniques (research methods)
82.80.Fk Electrochemical methods
01.30.Rr Surveys and tutorial papers; resource letters
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