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Top 20 Most Read Articles
June 2007
The 20 articles with the most full-text downloads during the month, in descending order.
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WSXM: A software for scanning probe microscopy and a tool for nanotechnology Rev. Sci. Instrum. 78, 013705 (2007); http://dx.doi.org/10.1063/1.2432410 (8 pages) Online Publication Date: 31 January 2007
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In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
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Invited Article: Linearization and signal recovery in photoacoustic infrared spectroscopy Rev. Sci. Instrum. 78, 051301 (2007); http://dx.doi.org/10.1063/1.2735447 (12 pages) Online Publication Date: 15 May 2007
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Photoacoustic (PA) infrared spectroscopy enables the characterization of a wide variety of materials, affording the spectroscopist several advantages over more traditional infrared methods. While PA spectra are readily acquired using commercial instrumentation, the quality of the data can be improved substantially through the use of specialized numerical and experimental procedures. Two of these methods are the subject of this review. Specifically, this article describes (a) linearization of PA infrared spectra, a calculation that incorporates phase and amplitude information to extend the range of linearity for strongly absorbing samples, and (b) lock-in and digital signal-recovery procedures in step-scan phase-modulation PA infrared spectroscopy. Linearization yields significant improvement in band definition, especially in the low-wavenumber region. This numerical method succeeds in situations where the PA phase of the sample is less than that of the reference (carbon black). When this criterion is not met initially, the sample or reference interferograms can be manipulated prior to the calculation. The steps involved in linearization are illustrated in detail and approximations are discussed. Lock-in demodulation of the step-scan phase-modulation signal is compared to digital (software) demodulation in this study; the lock-in technique is found to be superior in several cases. The imaginary interferograms in these experiments sometimes lack a strong central feature, a situation that necessitates the application of less commonly used methods for phase correction and spectrum calculation. These methods, which are available in commercial software, include two-quadrant and stored-phase corrections. The PA phase spectrum resembles amplitude and absorption spectra when real and imaginary PA spectra are correctly calculated.
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Rev. Sci. Instrum. 78, 061301 (2007); http://dx.doi.org/10.1063/1.2738946 (9 pages) Online Publication Date: 11 June 2007
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Analysis of the Raman Stokes peak position and its shift has been frequently used to estimate either temperature or stress in microelectronics and microelectromechanical system devices. However, if both fields are evolving simultaneously, the Stokes shift represents a convolution of these effects, making it difficult to measure either quantity accurately. By using the relative independence of the Stokes linewidth to applied stress, it is possible to deconvolve the signal into an estimation of both temperature and stress. Using this property, a method is presented whereby the temperature and stress were simultaneously measured in doped polysilicon microheaters. A data collection and analysis method was developed to reduce the uncertainty in the measured stresses resulting in an accuracy of ±40 MPa for an average applied stress of −325 MPa and temperature of 520 °C. Measurement results were compared to three-dimensional finite-element analysis of the microheaters and were shown to be in excellent agreement. This analysis shows that Raman spectroscopy has the potential to measure both evolving temperature and stress fields in devices using a single optical measurement.
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Experimental setup for low-energy laser-based angle resolved photoemission spectroscopy Rev. Sci. Instrum. 78, 053905 (2007); http://dx.doi.org/10.1063/1.2722413 (5 pages) Online Publication Date: 24 May 2007
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A laser-based angle resolved photoemission (ARPES) system utilizing 6 eV photons from the fourth harmonic of a mode-locked Ti:sapphire oscillator is described. This light source greatly increases the momentum resolution and photoelectron count rate, while reducing extrinsic background and surface sensitivity relative to higher energy light sources. In this review, the optical system is described, and special experimental considerations for low-energy ARPES are discussed. The calibration of the hemispherical electron analyzer for good low-energy angle-mode performance is also described. Finally, data from the heavily studied high Tc superconductor Bi2Sr2CaCu2O8+δ (Bi2212) is compared to the results from higher photon energies.
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Accurate particle position measurement from images Rev. Sci. Instrum. 78, 053704 (2007); http://dx.doi.org/10.1063/1.2735920 (10 pages) Online Publication Date: 4 May 2007
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The moment method is an image analysis technique for subpixel estimation of particle positions. The total error in the calculated particle position includes effects of pixel locking and random noise in each pixel. Pixel locking, also known as peak locking, is an artifact where calculated particle positions are concentrated at certain locations relative to pixel edges. We report simulations to gain an understanding of the sources of error and their dependence on parameters the experimenter can control. We suggest an algorithm, and we find optimal parameters an experimenter can use to minimize total error and pixel locking. For a dusty plasma experiment, we find that a subpixel accuracy of 0.017 pixel or better can be attained. These results are also useful for improving particle position measurement and particle tracking velocimetry using video microscopy in fields including colloids, biology, and fluid mechanics.
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Rev. Sci. Instrum. 78, 031101 (2007); http://dx.doi.org/10.1063/1.2709758 (20 pages) Online Publication Date: 30 March 2007
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The technique of atom probe tomography (APT) is reviewed with an emphasis on illustrating what is possible with the technique both now and in the future. APT delivers the highest spatial resolution (sub-0.3-nm) three-dimensional compositional information of any microscopy technique. Recently, APT has changed dramatically with new hardware configurations that greatly simplify the technique and improve the rate of data acquisition. In addition, new methods have been developed to fabricate suitable specimens from new classes of materials. Applications of APT have expanded from structural metals and alloys to thin multilayer films on planar substrates, dielectric films, semiconducting structures and devices, and ceramic materials. This trend toward a broader range of materials and applications is likely to continue.
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Cantilever spring constant calibration using laser Doppler vibrometry Rev. Sci. Instrum. 78, 063701 (2007); http://dx.doi.org/10.1063/1.2743272 (5 pages) Online Publication Date: 5 June 2007
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Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring constants, the accuracy of these methods can be limited by both the physical models themselves as well as uncertainties in their experimental implementation. Here we report the results from two of the most common calibration methods, the thermal tune method and the Sader method. These were implemented on a standard AFM system as well as using laser Doppler vibrometry (LDV). Using LDV eliminates some uncertainties associated with optical lever detection on an AFM. It also offers considerably higher signal to noise deflection measurements. We find that AFM and LDV result in similar uncertainty in the calibrated spring constants, about 5%, using either the thermal tune or Sader methods provided that certain limitations of the methods and instrumentation are observed.
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Rev. Sci. Instrum. 78, 050901 (2007); http://dx.doi.org/10.1063/1.2736265 (2 pages) Online Publication Date: 15 May 2007
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Impedance spectroscopy using maximum length sequences: Application to single cell analysis Rev. Sci. Instrum. 78, 054301 (2007); http://dx.doi.org/10.1063/1.2737751 (7 pages) Online Publication Date: 29 May 2007
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A maximum length sequence (MLS) is used to perform broadband impedance spectroscopy on a dielectric sample. The method has a number of advantages over other pulse-based or frequency sweep techniques. It requires the application of a very short sequence of voltage steps in the microsecond range and therefore allows the measurement of time-dependent impedance of a sample with high temporal resolution over a large bandwidth. The technique is demonstrated using a time-invariant passive RC network. The impedance of single biological cell flowing in a microfluidic channel is also measured, showing that MLS is an ideal method for high speed impedance analysis.
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Calibrating a tuning fork for use as a scanning probe microscope force sensor Rev. Sci. Instrum. 78, 063704 (2007); http://dx.doi.org/10.1063/1.2743166 (7 pages) Online Publication Date: 13 June 2007
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Quartz tuning forks mounted with sharp tips provide an alternate method to silicon microcantilevers for probing the tip-substrate interaction in scanning probe microscopy. The high quality factor and stable resonant frequency of the tuning fork allow accurate measurements of small shifts in the resonant frequency as the tip approaches the substrate. To permit an accurate measure of surface interaction forces, the electrical and piezoelectromechanical properties of a tuning fork have been characterized using a fiber optical interferometer.
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Low-noise rotating sample holder for ultrafast transient spectroscopy at cryogenic temperatures Rev. Sci. Instrum. 78, 053102 (2007); http://dx.doi.org/10.1063/1.2735557 (5 pages) Online Publication Date: 9 May 2007
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We present the design and testing of a rotating device that fits within a commercial helium cryostat and is capable of providing at 4 K a fresh sample surface for subsequent shots of a 1–10 kHz amplified pulsed laser. We benchmark this rotator in a transient-absorption experiment on molecular switches. After showing that the device introduces only a small amount of additional noise, we demonstrate how the effect of signal degradation due to high fluence is completely resolved.
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Rev. Sci. Instrum. 78, 054101 (2007); http://dx.doi.org/10.1063/1.2740165 (11 pages) Online Publication Date: 31 May 2007
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We present a newly designed highly sensitive micromechanical sensor devoted to thermodynamic studies involving supported clusters. The thermally sensitive element of the sensor consists of a micromachined silicon cantilever array, onto which a thin metal film is evaporated. Due to the difference between the thermal expansion coefficients of silicon and the metal employed, thermal bending is observed when heat is exchanged with the cantilever. The sensitivity and the response time of the cantilever are studied as a function of the film material (gold or aluminum) and the thickness of the metal film. With our routinely prepared cantilevers, a minimum power of 120 nW is measurable with a submillisecond response time, corresponding to a limit of detection in the femtojoule range. The high sensitivity of the sensor is demonstrated by measuring the heat exchange which occurs during the deposition of clusters on the cantilever. Experimentally, we illustrate the 1,3-butadiene hydrogenation reaction using a cluster model catalysts created by soft-landing palladium clusters onto the cantilever surface.
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Cantilever transducers as a platform for chemical and biological sensors Rev. Sci. Instrum. 75, 2229 (2004); http://dx.doi.org/10.1063/1.1763252 (25 pages) Online Publication Date: 21 June 2004
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Since the late 1980s there have been spectacular developments in micromechanical or microelectro-mechanical (MEMS) systems which have enabled the exploration of transduction modes that involve mechanical energy and are based primarily on mechanical phenomena. As a result an innovative family of chemical and biological sensors has emerged. In this article, we discuss sensors with transducers in a form of cantilevers. While MEMS represents a diverse family of designs, devices with simple cantilever configurations are especially attractive as transducers for chemical and biological sensors. The review deals with four important aspects of cantilever transducers: (i) operation principles and models; (ii) microfabrication; (iii) figures of merit; and (iv) applications of cantilever sensors. We also provide a brief analysis of historical predecessors of the modern cantilever sensors. © 2004 American Institute of Physics. |
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Compact variable-temperature scanning force microscope Rev. Sci. Instrum. 78, 053710 (2007); http://dx.doi.org/10.1063/1.2735568 (7 pages) Online Publication Date: 14 May 2007
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A compact design for a cryogenic variable-temperature scanning force microscope using a fiber-optic interferometer to measure cantilever deflection is presented. The tip-sample coarse approach and the lateral tip positioning are performed by piezoelectric positioners in situ. The microscope has been operated at temperatures between 6 and 300 K. It is designed to fit into an 8 T superconducting magnet with the field applied in the out-of-plane direction. The results of scanning in various modes are demonstrated, showing contrast based on magnetic field gradients or surface potentials.
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Rev. Sci. Instrum. 78, 056101 (2007); http://dx.doi.org/10.1063/1.2735911 (3 pages) Online Publication Date: 2 May 2007
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A novel design is the concept of preventing the camera lens from contamination of the particles by using “airwall.” An experimental wireless video camera debris deflecting system was realized and performed to verify the concept. Functional tests have been successfully verified.
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Calibration of atomic‐force microscope tips Rev. Sci. Instrum. 64, 1868 (1993); http://dx.doi.org/10.1063/1.1143970 (6 pages)
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Images and force measurements taken by an atomic‐force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional equipment. |
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Multifunctional fluorescence correlation microscope for intracellular and microfluidic measurements Rev. Sci. Instrum. 78, 053711 (2007); http://dx.doi.org/10.1063/1.2740053 (8 pages) Online Publication Date: 16 May 2007
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A modified fluorescence correlation microscope (FCM) was built on a commercial confocal laser scanning microscope (CLSM) by adding two sensitive detectors to perform fluorescence correlation spectroscopy (FCS). A single pinhole for both imaging and spectroscopy and a simple slider switch between the two modes thus facilitate the accurate positioning of the FCS observation volume after the confocal image acquisition. Due to the use of a single pinhole for CLSM and FCS the identity of imaged and spectroscopically observed positions is guaranteed. The presented FCM system has the capability to position the FCS observation volume at any point within the inner 30% of the field of view without loss in performance and in the inner 60% of the field of view with changes of FCS parameters of less than 10%. A single pinhole scheme for spatial fluorescence cross correlation spectroscopy performed on the FCM system is proposed to determine microfluidic flow angles. To show the applicability and versatility of the system, we measured the translational diffusion coefficients on the upper and lower membranes of Chinese hamster ovary cells. Two-photon excitation FCS was also realized by coupling a pulsed Ti: sapphire laser into the microscope and used for flow direction characterization in microchannels.
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Calibration of rectangular atomic force microscope cantilevers Rev. Sci. Instrum. 70, 3967 (1999); http://dx.doi.org/10.1063/1.1150021 (3 pages)
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A method to determine the spring constant of a rectangular atomic force microscope cantilever is proposed that relies solely on the measurement of the resonant frequency and quality factor of the cantilever in fluid (typically air), and knowledge of its plan view dimensions. This method gives very good accuracy and improves upon the previous formulation by Sader et al. [Rev. Sci. Instrum. 66, 3789 (1995)] which, unlike the present method, requires knowledge of both the cantilever density and thickness. © 1999 American Institute of Physics. |
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Rev. Sci. Instrum. 76, 061101 (2005); http://dx.doi.org/10.1063/1.1927327 (12 pages) Online Publication Date: 26 May 2005
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Nanoelectromechanical systems (NEMS) are drawing interest from both technical and scientific communities. These are electromechanical systems, much like microelectromechanical systems, mostly operated in their resonant modes with dimensions in the deep submicron. In this size regime, they come with extremely high fundamental resonance frequencies, diminished active masses,and tolerable force constants; the quality (Q) factors of resonance are in the range Q ∼ 103–105—significantly higher than those of electrical resonant circuits. These attributes collectively make NEMS suitable for a multitude of technological applications such as ultrafast sensors, actuators, and signal processing components. Experimentally, NEMS are expected to open up investigations of phonon mediated mechanical processes and of the quantum behavior of mesoscopic mechanical systems. However, there still exist fundamental and technological challenges to NEMS optimization. In this review we shall provide a balanced introduction to NEMS by discussing the prospects and challenges in this rapidly developing field and outline an exciting emerging application, nanoelectromechanical mass detection.
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Time‐of‐Flight Mass Spectrometer with Improved Resolution Rev. Sci. Instrum. 26, 1150 (1955); http://dx.doi.org/10.1063/1.1715212 (8 pages) Online Publication Date: 29 December 2004
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A new type of ion gun is described which greatly improves the resolution of a nonmagnetic time‐of‐flight mass spectrometer. The focusing action of this gun is discussed and analyzed mathematically. The validity of the analysis and the practicability of the gun are demonstrated by the spectra obtained. The spectrometer is capable of measuring the relative abundance of adjacent masses well beyond 100 amu. |
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