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Top 20 Most Read Articles
May 2007
The 20 articles with the most full-text downloads during the month, in descending order.
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WSXM: A software for scanning probe microscopy and a tool for nanotechnology Rev. Sci. Instrum. 78, 013705 (2007); http://dx.doi.org/10.1063/1.2432410 (8 pages) Online Publication Date: 31 January 2007
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In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
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Differential force microscope for long time-scale biophysical measurements Rev. Sci. Instrum. 78, 043711 (2007); http://dx.doi.org/10.1063/1.2727478 (6 pages) Online Publication Date: 30 April 2007
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Force microscopy techniques including optical trapping, magnetic tweezers, and atomic force microscopy (AFM) have facilitated quantification of forces and distances on the molecular scale. However, sensitivity and stability limitations have prevented the application of these techniques to biophysical systems that generate large forces over long times, such as actin filament networks. Growth of actin networks drives cellular shape change and generates nano-Newtons of force over time scales of minutes to hours, and consequently network growth properties have been difficult to study. Here, we present an AFM-based differential force microscope with integrated epifluorescence imaging in which two adjacent cantilevers on the same rigid support are used to provide increased measurement stability. We demonstrate 14 nm displacement control over measurement times of 3 hours and apply the instrument to quantify actin network growth in vitro under controlled loads. By measuring both network length and total network fluorescence simultaneously, we show that the average cross-sectional density of the growing network remains constant under static loads. The differential force microscope presented here provides a sensitive method for quantifying force and displacement with long time-scale stability that is useful for measurements of slow biophysical processes in whole cells or in reconstituted molecular systems in vitro.
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Accurate particle position measurement from images Rev. Sci. Instrum. 78, 053704 (2007); http://dx.doi.org/10.1063/1.2735920 (10 pages) Online Publication Date: 4 May 2007
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The moment method is an image analysis technique for subpixel estimation of particle positions. The total error in the calculated particle position includes effects of pixel locking and random noise in each pixel. Pixel locking, also known as peak locking, is an artifact where calculated particle positions are concentrated at certain locations relative to pixel edges. We report simulations to gain an understanding of the sources of error and their dependence on parameters the experimenter can control. We suggest an algorithm, and we find optimal parameters an experimenter can use to minimize total error and pixel locking. For a dusty plasma experiment, we find that a subpixel accuracy of 0.017 pixel or better can be attained. These results are also useful for improving particle position measurement and particle tracking velocimetry using video microscopy in fields including colloids, biology, and fluid mechanics.
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Rev. Sci. Instrum. 78, 043101 (2007); http://dx.doi.org/10.1063/1.2720725 (4 pages) Online Publication Date: 2 April 2007
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We report on a scheme to improve the pointing stability of the first order beam diffracted by an acousto-optic modulator (AOM). Due to thermal effects inside the crystal, the angular position of the beam can change by as much as 1 mrad when the radio-frequency power in the AOM is reduced to decrease the first order beam intensity. This is done, for example, to perform forced evaporative cooling in ultracold atom experiments using far-off-resonant optical traps. We solve this problem by driving the AOM with two radio frequencies f1 and f2. The power of f2 is adjusted relative to the power of f1 to keep the total power constant. Using this, the beam displacement is decreased by a factor of 20. The method is simple to implement in existing experimental setups, without any modification of the optics.
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200 ns pulse high-voltage supply for terahertz field emission Rev. Sci. Instrum. 78, 043103 (2007); http://dx.doi.org/10.1063/1.2724769 (3 pages) Online Publication Date: 16 April 2007
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We present a method of generating 200 ns high-voltage (up to 40 kV) pulses operating at repetition rates of up to 100 kHz, which may be synchronized with laser pulses. These supplies are simple to make and were developed for ultrafast terahertz pulse generation from GaAs photoconductive antennas using a high-repetition-rate regeneratively amplified laser. We also show an improvement in signal-to-noise ratio over a continuous dc bias field and application of the supply to terahertz pulse generation.
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Variable-temperature independently driven four-tip scanning tunneling microscope Rev. Sci. Instrum. 78, 053705 (2007); http://dx.doi.org/10.1063/1.2735593 (5 pages) Online Publication Date: 8 May 2007
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The authors have developed an ultrahigh vacuum (UHV) variable-temperature four-tip scanning tunneling microscope (STM), operating from room temperature down to 7 K, combined with a scanning electron microscope (SEM). Four STM tips are mechanically and electrically independent and capable of positioning in arbitrary configurations in nanometer precision. An integrated controller system for both of the multitip STM and SEM with a single computer has also been developed, which enables the four tips to operate either for STM imaging independently and for four-point probe (4PP) conductivity measurements cooperatively. Atomic-resolution STM images of graphite were obtained simultaneously by the four tips. Conductivity measurements by 4PP method were also performed at various temperatures with the four tips in square arrangement with direct contact to the sample surface.
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Rev. Sci. Instrum. 78, 031101 (2007); http://dx.doi.org/10.1063/1.2709758 (20 pages) Online Publication Date: 30 March 2007
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The technique of atom probe tomography (APT) is reviewed with an emphasis on illustrating what is possible with the technique both now and in the future. APT delivers the highest spatial resolution (sub-0.3-nm) three-dimensional compositional information of any microscopy technique. Recently, APT has changed dramatically with new hardware configurations that greatly simplify the technique and improve the rate of data acquisition. In addition, new methods have been developed to fabricate suitable specimens from new classes of materials. Applications of APT have expanded from structural metals and alloys to thin multilayer films on planar substrates, dielectric films, semiconducting structures and devices, and ceramic materials. This trend toward a broader range of materials and applications is likely to continue.
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Topography imaging with a heated atomic force microscope cantilever in tapping mode Rev. Sci. Instrum. 78, 043709 (2007); http://dx.doi.org/10.1063/1.2721422 (7 pages) Online Publication Date: 30 April 2007
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This article describes tapping mode atomic force microscopy (AFM) using a heated AFM cantilever. The electrical and thermal responses of the cantilever were investigated while the cantilever oscillated in free space or was in intermittent contact with a surface. The cantilever oscillates at its mechanical resonant frequency, 70.36 kHz, which is much faster than its thermal time constant of 300 μs, and so the cantilever operates in thermal steady state. The thermal impedance between the cantilever heater and the sample was measured through the cantilever temperature signal. Topographical imaging was performed on silicon calibration gratings of height 20 and 100 nm. The obtained topography sensitivity is as high as 200 μV/nm and the resolution is as good as 0.5 nm/Hz1/2, depending on the cantilever power. The cantilever heating power ranges 0–7 mW, which corresponds to a temperature range of 25–700 °C. The imaging was performed entirely using the cantilever thermal signal and no laser or other optics was required. As in conventional AFM, the tapping mode operation demonstrated here can suppress imaging artifacts and enable imaging of soft samples.
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High dynamic range streak camera for subpicosecond time-resolved x-ray spectroscopy Rev. Sci. Instrum. 78, 043503 (2007); http://dx.doi.org/10.1063/1.2720718 (8 pages) Online Publication Date: 11 April 2007
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The full characterization of a time resolved x-ray spectrometer is presented. It is based on the coupling of a conical crystal with a subpicosecond x-ray streak camera. The detector is designed to operate in accumulation mode at high repetition rate (up to 1 kHz) allowing signal to noise ratio as high as 104:1. Optical switches have been used to limit the jitter induced in the subpicosecond range, demonstrating the very long term stability (a few hours) of the entire device. The data analysis have been developed to get the spectral and temporal resolution of an ultrashort laser-plasma-based x-ray source.
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Easily fabricated magnetic traps for single-cell applications Rev. Sci. Instrum. 78, 044301 (2007); http://dx.doi.org/10.1063/1.2722400 (5 pages) Online Publication Date: 17 April 2007
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We describe a simple and inexpensive method of fabricating single cell magnetic traps within a polydimethylsiloxane (PDMS) device. These traps were developed as part of an automated system that captures individual yeast cells in a microfluidic device and analyzes each cell as it buds. To make the traps, PdCl2 catalyst is rubbed with vinyl foam onto plasma-patterned PDMS, and then Co-Ni-B alloy is electrolessly deposited onto the catalyst at a moderate temperature. We demonstrate individual yeast cell capture and estimate the capture force (1.9−4.4 pN) by measuring the flow speed required to remove the cell from its trap in a microfluidic channel.
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Compact variable-temperature scanning force microscope Rev. Sci. Instrum. 78, 053710 (2007); http://dx.doi.org/10.1063/1.2735568 (7 pages) Online Publication Date: 14 May 2007
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A compact design for a cryogenic variable-temperature scanning force microscope using a fiber-optic interferometer to measure cantilever deflection is presented. The tip-sample coarse approach and the lateral tip positioning are performed by piezoelectric positioners in situ. The microscope has been operated at temperatures between 6 and 300 K. It is designed to fit into an 8 T superconducting magnet with the field applied in the out-of-plane direction. The results of scanning in various modes are demonstrated, showing contrast based on magnetic field gradients or surface potentials.
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Calibration of atomic force microscope cantilevers using piezolevers Rev. Sci. Instrum. 78, 043704 (2007); http://dx.doi.org/10.1063/1.2719649 (8 pages) Online Publication Date: 12 April 2007
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The atomic force microscope (AFM) can provide qualitative information by numerous imaging modes, but it can also provide quantitative information when calibrated cantilevers are used. In this article a new technique is demonstrated to calibrate AFM cantilevers using a reference piezolever. Experiments are performed on 13 different commercially available cantilevers. The stiff cantilevers, whose stiffness is more than 0.4 N/m, are compared to the stiffness values measured using nanoindentation. The experimental data collected by the piezolever method is in good agreement with the nanoindentation data. Calibration with a piezolever is fast, easy, and nondestructive and a commercially available AFM is enough to perform the experiments. In addition, the AFM laser must not be calibrated. Calibration is reported here for cantilevers whose stiffness lies between 0.08 and 6.02 N/m.
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Automatization of nanotomography Rev. Sci. Instrum. 78, 053703 (2007); http://dx.doi.org/10.1063/1.2736359 (5 pages) Online Publication Date: 3 May 2007
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An approach for automated nanotomography, a layer-by-layer imaging technique based on scanning probe microscopy (SPM), is presented. Stepwise etching and imaging is done in situ in a liquid cell of an SPM. The flow of etching and rinsing solutions after each etching step is controlled with solenoid valves which allow for an automated measuring protocol. The thermal drift and the drift of the piezo scanner is corrected by applying offsets calculated from the cross correlation coefficients between successive images. As an example, we have imaged human bone with ∼ 10 nm resolution using tapping mode SPM and successive etching with hydrochloric acid.
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Adaptive Q control for tapping-mode nanoscanning using a piezoactuated bimorph probe Rev. Sci. Instrum. 78, 043707 (2007); http://dx.doi.org/10.1063/1.2722381 (8 pages) Online Publication Date: 18 April 2007
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A new approach, called adaptive Q control, for tapping-mode atomic force microscopy (AFM) is introduced and implemented on a homemade AFM setup utilizing a laser Doppler vibrometer and a piezoactuated bimorph probe. In standard Q control, the effective Q factor of the scanning probe is adjusted prior to the scanning depending on the application. However, there is a trade-off in setting the effective Q factor of an AFM probe. The Q factor is either increased to reduce the tapping forces or decreased to increase the maximum achievable scan speed. Realizing these two benefits simultaneously using standard Q control is not possible. In adaptive Q control, the Q factor of the probe is set to an initial value as in standard Q control, but then modified on the fly during scanning when necessary to achieve this goal. In this article, we present the basic theory behind adaptive Q control, the electronics enabling the online modification of the probe’s effective Q factor, and the results of the experiments comparing three different methods: scanning (a) without Q control, (b) with standard Q control, and (c) with adaptive Q control. The results show that the performance of adaptive Q control is superior to the other two methods.
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Rev. Sci. Instrum. 75, 2787 (2004); http://dx.doi.org/10.1063/1.1785844 (23 pages) Online Publication Date: 2 September 2004
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Since their invention just over 20 years ago, optical traps have emerged as a powerful tool with broad-reaching applications in biology and physics. Capabilities have evolved from simple manipulation to the application of calibrated forces on—and the measurement of nanometer-level displacements of—optically trapped objects. We review progress in the development of optical trapping apparatus, including instrument design considerations, position detection schemes and calibration techniques, with an emphasis on recent advances. We conclude with a brief summary of innovative optical trapping configurations and applications. |
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Time‐of‐Flight Mass Spectrometer with Improved Resolution Rev. Sci. Instrum. 26, 1150 (1955); http://dx.doi.org/10.1063/1.1715212 (8 pages) Online Publication Date: 29 December 2004
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A new type of ion gun is described which greatly improves the resolution of a nonmagnetic time‐of‐flight mass spectrometer. The focusing action of this gun is discussed and analyzed mathematically. The validity of the analysis and the practicability of the gun are demonstrated by the spectra obtained. The spectrometer is capable of measuring the relative abundance of adjacent masses well beyond 100 amu. |
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Rev. Sci. Instrum. 78, 043102 (2007); http://dx.doi.org/10.1063/1.2721409 (4 pages) Online Publication Date: 12 April 2007
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A simple technique is presented to obtain normalized photoacoustic (PA) spectra corrected for the spectral variation of the source in a single scan. The input light beam is passed through the center of a dual slot chopper, which splits it into two chopped output beams at two different frequencies at a fixed ratio. The beams fall on the sample and the reference kept side-by-side in the same sample chamber. The PA signals are detected by a microphone and processed by two lock-in amplifiers tuned at two different frequencies. The technique is tested by recording the PA spectra of standard samples.
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Invited Article: A unified evaluation of iterative projection algorithms for phase retrieval Rev. Sci. Instrum. 78, 011301 (2007); http://dx.doi.org/10.1063/1.2403783 (10 pages) Online Publication Date: 25 January 2007
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Iterative projection algorithms are successfully being used as a substitute of lenses to recombine, numerically rather than optically, light scattered by illuminated objects. Images obtained computationally allow aberration-free diffraction-limited imaging and the possibility of using radiation for which no lenses exist. The challenge of this imaging technique is transferred from the lenses to the algorithms. We evaluate these new computational “instruments” developed for the phase-retrieval problem, and discuss acceleration strategies.
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Rev. Sci. Instrum. 78, 053903 (2007); http://dx.doi.org/10.1063/1.2736417 (9 pages) Online Publication Date: 11 May 2007
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We have developed a new combined measurement system to investigate the underlying origins of forces on solid state surfaces from the viewpoint of atomic surface morphology. This system consists of two main parts: the measurements of force based on displacements and detailed atomic resolution observations of the surface morphology. The former involves a large sample cantilever and a capacitive detection method that provide sufficient resolution to detect changes of a few meV/atom or pN/atom at surfaces. For the latter, a scanning tunneling microscope was incorporated to observe structural changes occurring on the surface of the cantilever sample. Although this combined observation is not trivial, it was accomplished by carefully designing sample dimensions while suppressing the self-oscillation of the cantilever. To demonstrate the performance of this system a preliminary study of the room temperature adsorption of Br2 on the clean Si(111)-7×7 surface is presented.
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Calibration of rectangular atomic force microscope cantilevers Rev. Sci. Instrum. 70, 3967 (1999); http://dx.doi.org/10.1063/1.1150021 (3 pages)
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A method to determine the spring constant of a rectangular atomic force microscope cantilever is proposed that relies solely on the measurement of the resonant frequency and quality factor of the cantilever in fluid (typically air), and knowledge of its plan view dimensions. This method gives very good accuracy and improves upon the previous formulation by Sader et al. [Rev. Sci. Instrum. 66, 3789 (1995)] which, unlike the present method, requires knowledge of both the cantilever density and thickness. © 1999 American Institute of Physics. |
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