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Top 20 Most Read Articles
February 2011
The 20 articles with the most full-text downloads during the month, in descending order.
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WSXM: A software for scanning probe microscopy and a tool for nanotechnology Rev. Sci. Instrum. 78, 013705 (2007); http://dx.doi.org/10.1063/1.2432410 (8 pages) Online Publication Date: 31 January 2007
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In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
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Rev. Sci. Instrum. 82, 011301 (2011); http://dx.doi.org/10.1063/1.3532770 (9 pages) Online Publication Date: 21 January 2011
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In 2000 the first mirror suspensions to use a quasi-monolithic final stage were installed at the GEO600 detector site outside Hannover, pioneering the use of fused silica suspension fibers in long baseline interferometric detectors to reduce suspension thermal noise. Since that time, development of the production methods of fused silica fibers has continued. We present here a review of a novel CO2 laser-based fiber pulling machine developed for the production of fused silica suspensions for the next generation of interferometric gravitational wave detectors and for use in experiments requiring low thermal noise suspensions. We discuss tolerances, strengths, and thermal noise performance requirements for the next generation of gravitational wave detectors. Measurements made on fibers produced using this machine show a 0.8% variation in vertical stiffness and 0.05% tolerance on length, with average strengths exceeding 4 GPa, and mechanical dissipation which meets the requirements for Advanced LIGO thermal noise performance.
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Rev. Sci. Instrum. 82, 023701 (2011); http://dx.doi.org/10.1063/1.3524570 (6 pages) Online Publication Date: 4 February 2011
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We developed a total-internal-reflection (TIR) fluorescence microscopy using three dichroic mirrors and four charge-coupled devices (CCDs) to detect simultaneously four colors of single-molecule (SM) fluorophores. Four spectrally distinct species of fluorophores (Alexa 488, Cy3, Cy5, or Cy5.5) were each immobilized on a different fused silica slide. A species of fluorophores on the slide was irradiated simultaneously, by two excitation beams from an Ar ion laser (488 and 514.5 nm) and a diode laser (642 nm) through TIR on the slide surface. Fluorescence emitted from the fluorophores was spectrally resolved into four components by the dichroic mirrors, and four images were generated from them simultaneously and continuously, with the four CCDs at a rate of 10 Hz. A series of images was thus obtained with each CCD. Fluorescence spots for a species were observed mainly in the series of images recorded by its respective-color CCD. In the first image in the series, we picked out the spots as continuous pixel regions that had the values greater than a threshold. Then we selected only those spots that exhibited single-step photobleaching and regarded them as SM fluorescence spots. Pixel values of SM fluorescence spots widely differed. Some SM fluorophores had pixel values smaller than the threshold, and were left unpicked. Assuming the pixel values of SM fluorescence spots differed with a Gaussian profile, we estimated the ratios of unpicked fluorophores to be less than 20% for all the species. Because of the spectral overlaps between species, we also observed cross-talk spots into CCDs other than the respective-color CCDs. These cross-talk SM fluorescence spots can be mistaken for correct species. We thus introduced the classification method and classified SM fluorescence spots into correct species in accordance with two kinds of four-dimensional signal vectors. The error rates of fluorophore classification were estimated to be less than 3.2% for all the species. Our system is suitable for the biological studies that desire to simultaneously monitor the four colors of SM fluorophores. |
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Invited Review Article: A 10 mK scanning probe microscopy facility Rev. Sci. Instrum. 81, 121101 (2010); http://dx.doi.org/10.1063/1.3520482 (33 pages) Online Publication Date: 29 December 2010
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We describe the design, development and performance of a scanning probe microscopy (SPM) facility operating at a base temperature of 10 mK in magnetic fields up to 15 T. The microscope is cooled by a custom designed, fully ultra-high vacuum (UHV) compatible dilution refrigerator (DR) and is capable of in situ tip and sample exchange. Subpicometer stability at the tip-sample junction is achieved through three independent vibration isolation stages and careful design of the dilution refrigerator. The system can be connected to, or disconnected from, a network of interconnected auxiliary UHV chambers, which include growth chambers for metal and semiconductor samples, a field-ion microscope for tip characterization, and a fully independent additional quick access low temperature scanning tunneling microscope (STM) and atomic force microscope (AFM) system. To characterize the system, we present the cooling performance of the DR, vibrational, tunneling current, and tip-sample displacement noise measurements. In addition, we show the spectral resolution capabilities with tunneling spectroscopy results obtained on an epitaxial graphene sample resolving the quantum Landau levels in a magnetic field, including the sublevels corresponding to the lifting of the electron spin and valley degeneracies.
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Note: Production of sharp gold tips with high surface quality Rev. Sci. Instrum. 82, 026101 (2011); http://dx.doi.org/10.1063/1.3534078 (2 pages) Online Publication Date: 4 February 2011
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We present a simple method to produce sharp gold tips with excellent surface quality based on electrochemical etching with potassium chloride. Radii of curvature lie in the range of 20–40 nm and the surface roughness is measured to less than 0.8 nm. The tips are well suited for field emission, field ion microscopy, and likely for tip-enhanced Raman scattering as well as tip-enhanced near-field imaging.
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Rev. Sci. Instrum. 82, 029501 (2011); http://dx.doi.org/10.1063/1.3553029 (4 pages) Online Publication Date: 9 February 2011
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Femtosecond pulse shaping using spatial light modulators Rev. Sci. Instrum. 71, 1929 (2000); http://dx.doi.org/10.1063/1.1150614 (32 pages)
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We review the field of femtosecond pulse shaping, in which Fourier synthesis methods are used to generate nearly arbitrarily shaped ultrafast optical wave forms according to user specification. An emphasis is placed on programmable pulse shaping methods based on the use of spatial light modulators. After outlining the fundamental principles of pulse shaping, we then present a detailed discussion of pulse shaping using several different types of spatial light modulators. Finally, new research directions in pulse shaping, and applications of pulse shaping to optical communications, biomedical optical imaging, high power laser amplifiers, quantum control, and laser-electron beam interactions are reviewed. © 2000 American Institute of Physics. |
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Methods of single-molecule fluorescence spectroscopy and microscopy Rev. Sci. Instrum. 74, 3597 (2003); http://dx.doi.org/10.1063/1.1589587 (23 pages) Online Publication Date: 23 July 2003
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Optical spectroscopy at the ultimate limit of a single molecule has grown over the past dozen years into a powerful technique for exploring the individual nanoscale behavior of molecules in complex local environments. Observing a single molecule removes the usual ensemble average, allowing the exploration of hidden heterogeneity in complex condensed phases as well as direct observation of dynamical state changes arising from photophysics and photochemistry, without synchronization. This article reviews the experimental techniques of single-molecule fluorescence spectroscopy and microscopy with emphasis on studies at room temperature where the same single molecule is studied for an extended period. Key to successful single-molecule detection is the need to optimize signal-to-noise ratio, and the physical parameters affecting both signal and noise are described in detail. Four successful microscopic methods including the wide-field techniques of epifluorescence and total internal reflection, as well as confocal and near-field optical scanning microscopies are described. In order to extract the maximum amount of information from an experiment, a wide array of properties of the emission can be recorded, such as polarization, spectrum, degree of energy transfer, and spatial position. Whatever variable is measured, the time dependence of the parameter can yield information about excited state lifetimes, photochemistry, local environmental fluctuations, enzymatic activity, quantum optics, and many other dynamical effects. Due to the breadth of applications now appearing, single-molecule spectroscopy and microscopy may be viewed as useful new tools for the study of dynamics in complex systems, especially where ensemble averaging or lack of synchronization may obscure the details of the process under study. © 2003 American Institute of Physics. |
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Atom chips on direct bonded copper substrates Rev. Sci. Instrum. 82, 023101 (2011); http://dx.doi.org/10.1063/1.3529434 (7 pages) Online Publication Date: 10 February 2011
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We present the use of direct bonded copper (DBC) for the straightforward fabrication of high power atom chips. Atom chips using DBC have several benefits: excellent copper/substrate adhesion, high purity, thick (>100 μm) copper layers, high substrate thermal conductivity, high aspect ratio wires, the potential for rapid (<8 h) fabrication, and three-dimensional atom chip structures. Two mask options for DBC atom chip fabrication are presented, as well as two methods for etching wire patterns into the copper layer. A test chip, able to support 100 A of current for 2 s without failing, is used to determine the thermal impedance of the DBC. An assembly using two DBC atom chips is used to magnetically trap laser cooled 87Rb atoms. The wire aspect ratio that optimizes the magnetic field gradient as a function of power dissipation is determined to be 0.84:1 (height:width).
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Calibration of atomic‐force microscope tips Rev. Sci. Instrum. 64, 1868 (1993); http://dx.doi.org/10.1063/1.1143970 (6 pages)
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Images and force measurements taken by an atomic‐force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional equipment. |
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Rev. Sci. Instrum. 78, 031101 (2007); http://dx.doi.org/10.1063/1.2709758 (20 pages) Online Publication Date: 30 March 2007
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The technique of atom probe tomography (APT) is reviewed with an emphasis on illustrating what is possible with the technique both now and in the future. APT delivers the highest spatial resolution (sub-0.3-nm) three-dimensional compositional information of any microscopy technique. Recently, APT has changed dramatically with new hardware configurations that greatly simplify the technique and improve the rate of data acquisition. In addition, new methods have been developed to fabricate suitable specimens from new classes of materials. Applications of APT have expanded from structural metals and alloys to thin multilayer films on planar substrates, dielectric films, semiconducting structures and devices, and ceramic materials. This trend toward a broader range of materials and applications is likely to continue.
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Exploiting cantilever curvature for noise reduction in atomic force microscopy Rev. Sci. Instrum. 82, 013704 (2011); http://dx.doi.org/10.1063/1.3503220 (6 pages) Online Publication Date: 20 January 2011
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Optical beam deflection is a widely used method for detecting the deflection of atomic force microscope (AFM) cantilevers. This paper presents a first order derivation for the angular detection noise density which determines the lower limit for deflection sensing. Surprisingly, the cantilever radius of curvature, commonly not considered, plays a crucial role and can be exploited to decrease angular detection noise. We demonstrate a reduction in angular detection shot noise of more than an order of magnitude on a home-built AFM with a commercial 450 μm long cantilever by exploiting the optical properties of the cantilever curvature caused by the reflective gold coating. Lastly, we demonstrate how cantilever curvature can be responsible for up to 45% of the variability in the measured sensitivity of cantilevers on commercially available AFMs. |
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Rev. Sci. Instrum. 82, 027101 (2011); http://dx.doi.org/10.1063/1.3534845 (2 pages) Online Publication Date: 10 February 2011
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Libbrecht and Libbrecht recently described a thermoelectric temperature controller for which they claimed an absolute accuracy of 100 mK. They did not specify the heat-dissipation coefficient for their thermistor temperature sensor—which would dissipate more power than is usual in such circuits— nor make any allowance for self-heating in the thermistor. Self-heating can be expected to have introduced more than 100 mK of absolute error in their circuit.
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A constant-speed lowering mechanism for the crucibles Rev. Sci. Instrum. 82, 025101 (2011); http://dx.doi.org/10.1063/1.3527060 (5 pages) Online Publication Date: 1 February 2011
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The crystal growth characteristics of a certain material can be considerably influenced by the strain present in the growing crystal. Strain can be induced in various ways. One of the most common methods always presents in industrial processes, where attrition processes are always accompanied by generation of mechanical strain in a newly formed small crystal fragment obtained by mechanical stressing during preparation and handling. For this purpose, we have developed an apparatus which comprises a specially designed constant, special lowering device. The system was constructed for use with a Bridgeman furnace made in the laboratory for the crystal growth. The apparatus has been used with a variety of growth assemblies to grow crystals of materials with melting points in the range of 100–1000°C. |
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Surface magneto-optic Kerr effect Rev. Sci. Instrum. 71, 1243 (2000); http://dx.doi.org/10.1063/1.1150496 (13 pages)
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The surface magneto-optic Kerr effect (SMOKE) has significantly impacted research on magnetic thin films. This is due to its sensitivity, local probing nature, and experimental simplicity. The polar and longitudinal Kerr effects are characterized by a complex rotation of the plane of polarization of linearly polarized incident light upon reflection from the surface of a ferromagnetic material. The rotation is directly related to the magnetization of the material within the probing region of the light. Light penetrates into metals >20 nm deep, but the SMOKE technique derives its surface sensitivity from the limited thickness of the deposited magnetic film, which can be as thin as one atomic layer. Basic principles, experimental arrangements, and applications of SMOKE are reviewed in order to acquaint the nonspecialist with the technique and place it into perspective. © 2000 American Institute of Physics. |
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A large aperture magnification lens for velocity map imaging Rev. Sci. Instrum. 82, 013301 (2011); http://dx.doi.org/10.1063/1.3505491 (5 pages) Online Publication Date: 13 January 2011
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We have designed and implemented a large aperture electrostatic Einzel lens that magnifies the images of low energy ions or electrons in a standard velocity map imaging apparatus by up to a factor of 5 while allowing the normal use of the apparatus (without blocking any part of the detector). The field strength in the interaction region remains reasonably constant with or without magnification, and the lens can be used in the normal “crush” mode or with any of the different variants of the “slicing” mode. We have characterized the performance of the lens by imaging ion recoil due to two-photon resonant three-photon ionization [(2+1) REMPI] of O(3P2) atoms and by imaging slow NO molecules from the near-threshold photodissociation of the NO–Ar van der Waals complex. |
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Modulated 3D cross-correlation light scattering: Improving turbid sample characterization Rev. Sci. Instrum. 81, 123107 (2010); http://dx.doi.org/10.1063/1.3518961 (7 pages) Online Publication Date: 30 December 2010
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Accurate characterization using static light scattering (SLS) and dynamic light scattering (DLS) methods mandates the measurement and analysis of singly scattered light. In turbid samples, the suppression of multiple scattering is therefore required to obtain meaningful results. One powerful technique for achieving this, known as 3D cross-correlation, uses two simultaneous light scattering experiments performed at the same scattering vector on the same sample volume in order to extract only the single scattering information common to both. Here we present a significant improvement to this method in which the two scattering experiments are temporally separated by modulating the incident laser beams and gating the detector outputs at frequencies exceeding the timescale of the system dynamics. This robust modulation scheme eliminates cross-talk between the two beam-detector pairs and leads to a fourfold improvement in the cross-correlation intercept. We measure the dynamic and angular-dependent scattering intensity of turbid colloidal suspensions and exploit the improved signal quality of the modulated 3D cross-correlation DLS and SLS techniques.
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Rev. Sci. Instrum. 75, 2787 (2004); http://dx.doi.org/10.1063/1.1785844 (23 pages) Online Publication Date: 2 September 2004
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Since their invention just over 20 years ago, optical traps have emerged as a powerful tool with broad-reaching applications in biology and physics. Capabilities have evolved from simple manipulation to the application of calibrated forces on—and the measurement of nanometer-level displacements of—optically trapped objects. We review progress in the development of optical trapping apparatus, including instrument design considerations, position detection schemes and calibration techniques, with an emphasis on recent advances. We conclude with a brief summary of innovative optical trapping configurations and applications. |
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Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization Rev. Sci. Instrum. 81, 123708 (2010); http://dx.doi.org/10.1063/1.3525058 (4 pages) Online Publication Date: 30 December 2010
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We introduce a new type of microscopy which is capable of investigating surface topography and electrical property of conductive and dielectric materials simultaneously on a nanometer scale. The microwave atomic force microscopy is a combination of the principles of the scanning probe microscope and the microwave-measurement technique. As a result, under the noncontact AFM working conditions, we successfully generated a microwave image of a 200-nm Au film coating on a glass wafer substrate with a spatial resolution of 120 nm and a measured voltage difference of 19.2 mV between the two materials. |
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Thermal conductivity measurement from 30 to 750 K: the 3ω method Rev. Sci. Instrum. 61, 802 (1990); http://dx.doi.org/10.1063/1.1141498 (7 pages)
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An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black‐body radiation are calculated to be less than 2% even at 1000 K. Data for a‐SiO2, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques. |
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