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Top 20 Most Read Articles

February 2008

The 20 articles with the most full-text downloads during the month, in descending order.


WSXM: A software for scanning probe microscopy and a tool for nanotechnology

I. Horcas, R. Fernández, J. M. Gómez-Rodríguez, J. Colchero, J. Gómez-Herrero, and A. M. Baro

Rev. Sci. Instrum. 78, 013705 (2007); http://dx.doi.org/10.1063/1.2432410 (8 pages)

Online Publication Date: 31 January 2007

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In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
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07.79.Cz Scanning tunneling microscopes

Novel instrument for surface plasmon polariton tracking in space and time

M. Sandtke, R. J. P. Engelen, H. Schoenmaker, I. Attema, H. Dekker, I. Cerjak, J. P. Korterik, F. B. Segerink, and L. Kuipers

Rev. Sci. Instrum. 79, 013704 (2008); http://dx.doi.org/10.1063/1.2825463 (10 pages)

Online Publication Date: 10 January 2008

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We describe the realization of a phase-sensitive and ultrafast near-field microscope, optimized for investigation of surface plasmon polariton propagation. The apparatus consists of a homebuilt near-field microscope that is incorporated in Mach-Zehnder-type interferometer which enables heterodyne detection. We show that this microscope is able to measure dynamical properties of both photonic and plasmonic systems with phase sensitivity.
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07.79.Fc Near-field scanning optical microscopes
68.37.Uv Near-field scanning microscopy and spectroscopy
07.60.Ly Interferometers
73.20.Mf Collective excitations (including excitons, polarons, plasmons and other charge-density excitations)
73.22.Lp Collective excitations
71.36.+c Polaritons (including photon-phonon and photon-magnon interactions)

Invited Review Article: Contemporary instrumentation and application of charge exchange neutral particle diagnostics in magnetic fusion energy experiments

S. S. Medley, A. J. H. Donné, R. Kaita, A. I. Kislyakov, M. P. Petrov, and A. L. Roquemore

Rev. Sci. Instrum. 79, 011101 (2008); http://dx.doi.org/10.1063/1.2823259 (16 pages)

Online Publication Date: 23 January 2008

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An overview of the developments postcirca 1980s in the instrumentation and application of charge exchange neutral particle diagnostics on magnetic fusion energy experiments is presented. First, spectrometers that employ only electric fields and hence provide ion energy resolution but not mass resolution are discussed. Next, spectrometers that use various geometrical combinations of both electric and magnetic fields to provide both energy and mass resolutions are reviewed. Finally, neutral particle diagnostics based on utilization of time-of-flight techniques are presented.
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52.70.-m Plasma diagnostic techniques and instrumentation

Compact electron beam ion sources/traps: Review and prospects (invited)

G. Zschornack, M. Kreller, V. P. Ovsyannikov, F. Grossman, U. Kentsch, M. Schmidt, F. Ullmann, and R. Heller

Rev. Sci. Instrum. 79, 02A703 (2008); http://dx.doi.org/10.1063/1.2804901 (5 pages)

Online Publication Date: 6 February 2008

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The Dresden electron beam ion trap (EBIT)/electron beam ion source (EBIS) family are very compact and economically working table-top ion sources. We report on the development of three generations of such ion sources, the so-called Dresden EBIT, Dresden EBIS, and Dresden EBIS-A, respectively. The ion sources are classified by different currents of extractable ions at different charge states and by the x-ray spectra emitted by the ions inside the electron beam. We present examples of x-ray measurements and measured ion currents extracted from the ion sources at certain individual operating conditions. Ion charge states of up to Xe48+ but also bare nuclei of lighter elements up to nickel have been extracted. The application potential of the ion sources is demonstrated via proof-of-concept applications employing an EBIT in a focused ion beam (FIB) column or using an EBIT for the production of nanostructures by single ion hits. Additionally we give first information about the next generation of the Dresden EBIS series. The so-called Dresden EBIS-SC is a compact and cryogen-free superconducting high-B-field EBIS for high-current operation.
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07.77.Ka Charged-particle beam sources and detectors
29.25.Ni Ion sources: positive and negative
07.85.Fv X- and γ-ray sources, mirrors, gratings, and detectors
85.25.Qc Superconducting surface acoustic wave devices and other superconducting devices

Cantilever transducers as a platform for chemical and biological sensors

Nickolay V. Lavrik, Michael J. Sepaniak, and Panos G. Datskos

Rev. Sci. Instrum. 75, 2229 (2004); http://dx.doi.org/10.1063/1.1763252 (25 pages)

Online Publication Date: 21 June 2004

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Since the late 1980s there have been spectacular developments in micromechanical or microelectro-mechanical (MEMS) systems which have enabled the exploration of transduction modes that involve mechanical energy and are based primarily on mechanical phenomena. As a result an innovative family of chemical and biological sensors has emerged. In this article, we discuss sensors with transducers in a form of cantilevers. While MEMS represents a diverse family of designs, devices with simple cantilever configurations are especially attractive as transducers for chemical and biological sensors. The review deals with four important aspects of cantilever transducers: (i) operation principles and models; (ii) microfabrication; (iii) figures of merit; and (iv) applications of cantilever sensors. We also provide a brief analysis of historical predecessors of the modern cantilever sensors. © 2004 American Institute of Physics.
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07.07.Mp Transducers
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
87.80.-y Biophysical techniques (research methods)
82.80.Fk Electrochemical methods
01.30.Rr Surveys and tutorial papers; resource letters

Phase-locked laser system for use in atomic coherence experiments

Alberto M. Marino and C. R. Stroud, Jr.

Rev. Sci. Instrum. 79, 013104 (2008); http://dx.doi.org/10.1063/1.2823330 (8 pages)

Online Publication Date: 11 January 2008

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We describe a phase-coherent laser system designed for use in experiments involving coherently prepared atomic media. We implement a simple technique based on a sample-and-hold circuit together with a reset of the integrating electronics that makes it possible to scan continuously the relative frequency between the lasers of over tens of gigahertz while keeping them phase locked. The system consists of three external-cavity diode lasers operating around 795 nm. A low-power laser serves as a frequency reference for two high-power lasers which are phased locked with an optical phase-locked loop. We measured the residual phase noise of the system to be less than 0.04 rad2. In order to show the application of the system towards atomic coherence experiments, we used it to implement electromagnetically induced transparency in a rubidium vapor cell and obtained a reduction in the absorption coefficient of 92%.
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42.60.Fc Modulation, tuning, and mode locking
42.25.Kb Coherence
42.55.Px Semiconductor lasers; laser diodes
42.50.Gy Effects of atomic coherence on propagation, absorption, and amplification of light; electromagnetically induced transparency and absorption
42.50.Md Optical transient phenomena: quantum beats, photon echo, free-induction decay, dephasings and revivals, optical nutation, and self-induced transparency

Femtosecond pulse shaping using spatial light modulators

A. M. Weiner

Rev. Sci. Instrum. 71, 1929 (2000); http://dx.doi.org/10.1063/1.1150614 (32 pages)

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We review the field of femtosecond pulse shaping, in which Fourier synthesis methods are used to generate nearly arbitrarily shaped ultrafast optical wave forms according to user specification. An emphasis is placed on programmable pulse shaping methods based on the use of spatial light modulators. After outlining the fundamental principles of pulse shaping, we then present a detailed discussion of pulse shaping using several different types of spatial light modulators. Finally, new research directions in pulse shaping, and applications of pulse shaping to optical communications, biomedical optical imaging, high power laser amplifiers, quantum control, and laser-electron beam interactions are reviewed. © 2000 American Institute of Physics.
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42.65.Re Ultrafast processes; optical pulse generation and pulse compression
42.79.Hp Optical processors, correlators, and modulators
01.30.Rr Surveys and tutorial papers; resource letters
42.60.Fc Modulation, tuning, and mode locking

Calibration of atomic‐force microscope tips

Jeffrey L. Hutter and John Bechhoefer

Rev. Sci. Instrum. 64, 1868 (1993); http://dx.doi.org/10.1063/1.1143970 (6 pages)

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Images and force measurements taken by an atomic‐force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional equipment.
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68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
87.64.Dz Scanning tunneling and atomic force microscopy

Measurement of temperature of laser cooled atoms by one-dimensional expansion in a magneto-optical trap

S. Pradhan and B. N. Jagatap

Rev. Sci. Instrum. 79, 013101 (2008); http://dx.doi.org/10.1063/1.2827517 (4 pages)

Online Publication Date: 2 January 2008

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We discuss a simple time of flight technique for measurement of temperature of a cold cloud in a magneto-optical trap (MOT). The technique is based on spatiotemporal fluorescence imaging of the cloud that is allowed to undergo one-dimensional expansion in the presence of the orthogonal two-dimensional configuration of laser beams by temporal modulation of a pair of counterpropagating trapping beams in the MOT. We show that, in the time scale 0 ⩽ t<5 ms, the expansion of the cloud is ballistic and the temperature can be extracted from the time variation of the rms size of the cloud in the expansion direction. The reliability of the technique has been established by comparing the results with release and recapture method, and also by fitting them to the known temperature scaling law.
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37.10.Gh Atom traps and guides
32.60.+i Zeeman and Stark effects
32.50.+d Fluorescence, phosphorescence (including quenching)
32.80.-t Photoionization and excitation

A simple method for producing flattened atomic force microscopy tips

P. Biagioni, J. N. Farahani, P. Mühlschlegel, H.-J. Eisler, D. W. Pohl, and B. Hecht

Rev. Sci. Instrum. 79, 016103 (2008); http://dx.doi.org/10.1063/1.2834875 (2 pages)

Online Publication Date: 18 January 2008

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We describe a simple and reliable procedure for obtaining a flat plateau on top of standard silicon nitride atomic force microscopy tips by scanning them over the focus of a high-numerical-aperture objective illuminated by near-infrared ultrashort laser pulses. Flattened tips produced this way exhibit a plateau that is parallel to the substrate when the cantilever is mounted. They represent a valid and cost-effective alternative to commercially available plateau tips.
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68.37.Ps Atomic force microscopy (AFM)
07.79.Lh Atomic force microscopes

Atomic force microscope cantilever spring constant evaluation for higher mode oscillations: A kinetostatic method

Yakov M. Tseytlin

Rev. Sci. Instrum. 79, 025102 (2008); http://dx.doi.org/10.1063/1.2839019 (7 pages)

Online Publication Date: 7 February 2008

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Our previous study of the particle mass sensor has shown a large ratio (up to thousands) between the spring constants of a rectangular cantilever in higher mode vibration and at the static bending or natural mode vibration. This has been proven by us through the derived nodal point position equation. That solution is good for a cantilever with the free end in noncontact regime and the probe shifted from the end to an effective section and contacting a soft object. Our further research shows that the same nodal position equation with the proper frequency equations may be used for the same spring constant ratio estimation if the vibrating at higher mode cantilever’s free end has a significant additional mass clamped to it or that end is in permanent contact with an elastic or hard measurand object (reference cantilever). However, in the latter case, the spring constant ratio is much smaller (in tens) than in other mentioned cases at equal higher (up to fourth) vibration modes. We also present the spring constant ratio for a vibrating at higher eigenmode V-shaped cantilever, which is now in wide use for atomic force microscopy. The received results on the spring constant ratio are in good (within a few percent) agreement with the theoretical and experimental data published by other researchers. The knowledge of a possible spring constant transformation is important for the proper calibration and use of an atomic force microscope with vibrating cantilever in the higher eigenmodes for measurement and imaging with enlarged resolution.
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07.79.Lh Atomic force microscopes
06.20.fb Standards and calibration

Two-axis probing system for atomic force microscopy

G. R. Jayanth, Sissy M. Jhiang, and Chia-Hsiang Menq

Rev. Sci. Instrum. 79, 023705 (2008); http://dx.doi.org/10.1063/1.2841805 (5 pages)

Online Publication Date: 14 February 2008

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A novel two-axis probing system is proposed for multiaxis atomic force microscopy (AFM). It employs a compliant manipulator that is optimally designed in terms of geometries and kinematics, and is actuated by multiple magnetic actuators to simultaneously control tip position and change tip orientation to achieve greater accessibility of the sample surface when imaging surfaces having large geometric variations. It leads to the creation of a multiaxis AFM system, which is a three-dimensional surface tool rather than a two-dimensional planar surface tool. The use of the system to scan the bottom corner of a grating step is reported.
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07.79.Lh Atomic force microscopes
07.07.Tw Servo and control equipment; robots

Methods of single-molecule fluorescence spectroscopy and microscopy

W. E. Moerner and David P. Fromm

Rev. Sci. Instrum. 74, 3597 (2003); http://dx.doi.org/10.1063/1.1589587 (23 pages)

Online Publication Date: 23 July 2003

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Optical spectroscopy at the ultimate limit of a single molecule has grown over the past dozen years into a powerful technique for exploring the individual nanoscale behavior of molecules in complex local environments. Observing a single molecule removes the usual ensemble average, allowing the exploration of hidden heterogeneity in complex condensed phases as well as direct observation of dynamical state changes arising from photophysics and photochemistry, without synchronization. This article reviews the experimental techniques of single-molecule fluorescence spectroscopy and microscopy with emphasis on studies at room temperature where the same single molecule is studied for an extended period. Key to successful single-molecule detection is the need to optimize signal-to-noise ratio, and the physical parameters affecting both signal and noise are described in detail. Four successful microscopic methods including the wide-field techniques of epifluorescence and total internal reflection, as well as confocal and near-field optical scanning microscopies are described. In order to extract the maximum amount of information from an experiment, a wide array of properties of the emission can be recorded, such as polarization, spectrum, degree of energy transfer, and spatial position. Whatever variable is measured, the time dependence of the parameter can yield information about excited state lifetimes, photochemistry, local environmental fluctuations, enzymatic activity, quantum optics, and many other dynamical effects. Due to the breadth of applications now appearing, single-molecule spectroscopy and microscopy may be viewed as useful new tools for the study of dynamics in complex systems, especially where ensemble averaging or lack of synchronization may obscure the details of the process under study. © 2003 American Institute of Physics.
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07.57.-c Infrared, submillimeter wave, microwave and radiowave instruments and equipment
07.60.-j Optical instruments and equipment
07.60.Pb Conventional optical microscopes
07.79.Fc Near-field scanning optical microscopes
07.60.Rd Visible and ultraviolet spectrometers

Invited article: Vector and Bragg Magneto-optical Kerr effect for the analysis of nanostructured magnetic arrays

A. Westphalen, M.-S. Lee, A. Remhof, and H. Zabel

Rev. Sci. Instrum. 78, 121301 (2007); http://dx.doi.org/10.1063/1.2821148 (15 pages)

Online Publication Date: 12 December 2007

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Experimental and theoretical aspects of obtaining the magnetic information carried by laser beams diffracted from an array of micro- or nanosized magnetic objects are reviewed. We report on the fundamentals of vector magneto-optic Kerr effect (MOKE), Bragg-MOKE, and second-order effects in the Kerr signal in longitudinal Kerr geometry as well as on an experimental setup used for vector and Bragg-MOKE experiments. The vector and Bragg-MOKE technique in combination with micromagnetic simulation is a reliable tool for measuring the complete magnetization vector and for characterizing the reversal mechanism of lateral magnetic nanostructures. We discuss the Bragg-MOKE effect for three standard domain configurations during the magnetization reversal process and present the expected behavior of the magnetic hysteresis loops.
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78.20.Ls Magneto-optical effects
75.60.Ej Magnetization curves, hysteresis, Barkhausen and related effects
75.60.Jk Magnetization reversal mechanisms
75.50.Tt Fine-particle systems; nanocrystalline materials

Ultrasensitive ultraviolet-visible 20 fs absorption spectroscopy of low vapor pressure molecules in the gas phase

C. Schriever, S. Lochbrunner, E. Riedle, and D. J. Nesbitt

Rev. Sci. Instrum. 79, 013107 (2008); http://dx.doi.org/10.1063/1.2834877 (9 pages)

Online Publication Date: 24 January 2008

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We describe an ultrasensitive pump-probe spectrometer for transient absorption measurements in the gas phase and in solution. The tunable UV pump and the visible (450–740 nm) probe pulses are generated by two independently tunable noncollinear optical parametric amplifiers, providing a temporal resolution of 20 fs. A homebuilt low gain photodetector is used to accommodate strong probe pulses with a shot noise significantly lower than the overall measurement noise. A matched digitizing scheme for single shot analysis of the light pulses at kilohertz repetition rates that minimizes the electronic noise contributions to the transient absorption signal is developed. The data processing scheme is optimized to yield best suppression of the laser excess noise and thereby transient absorbance changes down to 1.1×10−6 can be resolved. A collinear focusing geometry optimized for a 50 mm interaction length combined with a heatable gas cell allows us to perform measurements on substances with low vapor pressures, e.g., on medium sized molecules which are crystalline at room temperature. As an application example highlighting the capability of this instrument, we present the direct time-domain observation of the ultrafast excited state intramolecular proton transfer of 2-(2′-hydroxyphenyl)benzothiazole in the gas phase. We are able to compare the resulting dynamics in the gas phase and in solution with a temporal precision of better than 5 fs.
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51.70.+f Optical and dielectric properties
33.20.Lg Ultraviolet spectra
33.20.Kf Visible spectra

Nanoelectromechanical systems

K. L. Ekinci and M. L. Roukes

Rev. Sci. Instrum. 76, 061101 (2005); http://dx.doi.org/10.1063/1.1927327 (12 pages)

Online Publication Date: 26 May 2005

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Nanoelectromechanical systems (NEMS) are drawing interest from both technical and scientific communities. These are electromechanical systems, much like microelectromechanical systems, mostly operated in their resonant modes with dimensions in the deep submicron. In this size regime, they come with extremely high fundamental resonance frequencies, diminished active masses,and tolerable force constants; the quality (Q) factors of resonance are in the range Q ∼ 103–105—significantly higher than those of electrical resonant circuits. These attributes collectively make NEMS suitable for a multitude of technological applications such as ultrafast sensors, actuators, and signal processing components. Experimentally, NEMS are expected to open up investigations of phonon mediated mechanical processes and of the quantum behavior of mesoscopic mechanical systems. However, there still exist fundamental and technological challenges to NEMS optimization. In this review we shall provide a balanced introduction to NEMS by discussing the prospects and challenges in this rapidly developing field and outline an exciting emerging application, nanoelectromechanical mass detection.
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85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
85.35.-p Nanoelectronic devices

Time‐of‐Flight Mass Spectrometer with Improved Resolution

W. C. Wiley and I. H. McLaren

Rev. Sci. Instrum. 26, 1150 (1955); http://dx.doi.org/10.1063/1.1715212 (8 pages)

Online Publication Date: 29 December 2004

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A new type of ion gun is described which greatly improves the resolution of a nonmagnetic time‐of‐flight mass spectrometer. The focusing action of this gun is discussed and analyzed mathematically. The validity of the analysis and the practicability of the gun are demonstrated by the spectra obtained. The spectrometer is capable of measuring the relative abundance of adjacent masses well beyond 100 amu.

A calibration method for lateral forces for use with colloidal probe force microscopy cantilevers

M. A. S. Quintanilla and D. T. Goddard

Rev. Sci. Instrum. 79, 023701 (2008); http://dx.doi.org/10.1063/1.2836327 (11 pages)

Online Publication Date: 1 February 2008

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A calibration method is described for colloidal probe cantilevers that enables friction force measurements obtained using lateral force microscopy (LFM) to be quantified. The method is an adaptation of the lever method of Feiler et al. [ A. Feiler, P. Attard, and I. Larson, Rev. Sci. Instum. 71, 2746 (2000) ] and uses the advantageous positioning of probe particles that are usually offset from the central axis of the cantilever. The main sources of error in the calibration method are assessed, in particular, the potential misalignment of the long axis of the cantilever that ideally should be perpendicular to the photodiode detector. When this is not taken into account, the misalignment is shown to have a significant effect on the cantilever torsional stiffness but not on the lateral photodiode sensitivity. Also, because the friction signal is affected by the topography of the substrate, the method presented is valid only against flat substrates. Two types of particles, 20 μm glass beads and UO3 agglomerates attached to silicon tapping mode cantilevers were used to test the method against substrates including glass, cleaved mica, and UO2 single crystals. Comparisons with the lateral compliance method of Cain et al. [ R. G. Cain, S. Biggs, and N. W. Page, J. Colloid Interface Sci. 227, 55 (2000) ] are also made.
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06.20.fb Standards and calibration
07.79.Lh Atomic force microscopes
07.10.Pz Instruments for strain, force, and torque
62.20.Qp Friction, tribology, and hardness
81.40.Pq Friction, lubrication, and wear

Optical trapping

Keir C. Neuman and Steven M. Block

Rev. Sci. Instrum. 75, 2787 (2004); http://dx.doi.org/10.1063/1.1785844 (23 pages)

Online Publication Date: 2 September 2004

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Since their invention just over 20 years ago, optical traps have emerged as a powerful tool with broad-reaching applications in biology and physics. Capabilities have evolved from simple manipulation to the application of calibrated forces on—and the measurement of nanometer-level displacements of—optically trapped objects. We review progress in the development of optical trapping apparatus, including instrument design considerations, position detection schemes and calibration techniques, with an emphasis on recent advances. We conclude with a brief summary of innovative optical trapping configurations and applications.
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37.10.Vz Mechanical effects of light on atoms, molecules, and ions
06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
01.30.Rr Surveys and tutorial papers; resource letters
06.20.F- Units and standards
87.80.Cc Optical trapping

Calibration of rectangular atomic force microscope cantilevers

John E. Sader, James W. M. Chon, and Paul Mulvaney

Rev. Sci. Instrum. 70, 3967 (1999); http://dx.doi.org/10.1063/1.1150021 (3 pages)

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A method to determine the spring constant of a rectangular atomic force microscope cantilever is proposed that relies solely on the measurement of the resonant frequency and quality factor of the cantilever in fluid (typically air), and knowledge of its plan view dimensions. This method gives very good accuracy and improves upon the previous formulation by Sader et al. [Rev. Sci. Instrum. 66, 3789 (1995)] which, unlike the present method, requires knowledge of both the cantilever density and thickness. © 1999 American Institute of Physics.
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07.79.Lh Atomic force microscopes
06.20.F- Units and standards
07.10.Cm Micromechanical devices and systems
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