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Elemental and magnetic sensitive imaging using x-ray excited luminescence microscopy
R.A. Rosenberg, S. Zohar, D. Keavney, R. Divan, D. Rosenmann, A. Mascarenhas, and M.A. Steiner
A new microscope based on x-ray excited luminescence microscopy (XELM) is described that will allow elemental and magnetic specific imaging of a variety of energy-related materials. Results are given for solar-cell and magnetic materials and indicate that a resolution of 1µm or better is possible.
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