Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition

Yukinori Kinoshita, Yoshitaka Naitoh, Yan Jun Li, and Yasuhiro Sugawara

Tungsten tips made from tungsten wires have been used very frequently for Field Ion Microscopy(FIM) and Atom-Probe (FIM). Si cantilevers have been much used for Atomic Force Microscopy (AFM). One reason for this is that they can be lithographically made, for example, as a ganged set. This paper shows how to wed these two technologies. This development has the potential to significantly impact both AFM and FIM.

Rev. Sci. Instrum. 82, 113707 (2011)

Circular mode: A new scanning probe microscopy method for investigating surface properties at constant and continuous scanning velocities

Hussein Nasrallah, Pierre-Emmanuel Mazeran, and Olivier Noël

The circular mode offers expanded capabilities for surface investigations—especially for measuring physical properties that require high scanning velocities and/or continuous displacement with no rest periods.

Rev. Sci. Instrum. 82, 113703 (2011)

A light emitting diode based photoelectrochemical screener for distributed combinatorial materials discovery

Gates R. Winkler and Jay R. Winkler

A system that uses an array of pulsed LEDs synchronized with a two-electrode potentiostat that can measure the photoelectrochemical responses of combinatorial sample arrays deposited on conducting glass plates is developed. Compared to raster scanning methods, this LED system trades spatial resolution for a substantial reduction in scan time.

Rev. Sci. Instrum. 82, 114101 (2011)

Invited Review Article: Interferometric gravity wave detectors

G. Cella and A. Giazotto

In this review, the authors discuss interferometric detection of gravitational waves from an instrumental point of view. Conceptually important issues are addressed with an audience of non-experts in mind. A particular emphasis is given to the description of the current limitations and to the perspectives of exceeding those limits.

 

Rev. Sci. Instrum. 82, 101101 (2011)